Abstract
PZT films were fabricated using various targets of Pb(Zr x Ti1 - x )O3 with Zr/Ti ratios of 70/30, 58/42, 52/48, 45/55 and 30/70, and with excess PbO of 20 wt% on Pt/Ti/SiO2/Si(100) substrates. The rosette structure was observed in the films derived from the target with a Zr/Ti ratio of 70/30 and disappeared with increasing titanium composition. The observations on surface and cross-sectional microstructure were consistent with a higher perovskite nucleation for the higher Ti content films. The PZT films derived from the target with a Zr/Ti ratio of 45/55 had a polycrystalline columnar microstructure extending throughout the thickness of the film and no pyrochlore phase on the surface was observed. The PZT films derived from the target with a Zr/Ti ratio of 45/55 exhibited better electric properties than those derived from the target with a Zr/Ti ratio of 52/48.
| Original language | English |
|---|---|
| Pages (from-to) | 41-45 |
| Number of pages | 5 |
| Journal | Journal of Electroceramics |
| Volume | 13 |
| Issue number | 1-3 |
| DOIs | |
| State | Published - Jul 2004 |
| Externally published | Yes |
Keywords
- Crystalline phases
- Ferroelectric properties
- Lead zirconate titanate
- Microstructure
- Pulsed laser deposition
- Thin film
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