Effect of oxygen pressure on structure and properties of Bi 1.5 Zn 1.0 Nb 1.5 O 7 pyrochlore thin films prepared by pulsed laser deposition

Research output: Contribution to journalArticlepeer-review

31 Scopus citations

Abstract

The Bi 2 O 3 -ZnO-Nb 2 O 5 (BZN) cubic pyrochlore thin films were prepared on Pt/TiO 2 /SiO 2 /Si(1 0 0) substrates by using pulsed laser deposition process. The oxygen pressure was varied in the range of 5-50 Pa to investigate its effect on the structure and dielectric properties of BZN thin films. It is found that oxygen pressure during deposition plays an important role on structure and other properties of BZN films. The BZN films deposited at temperature of 650 °C and at O 2 pressure of 5 Pa have an amorphous BZN and Nb 2 O 5 phases but exhibits a cubic pyrochlore structure with a preferential (2 2 2) orientation when the oxygen pressure increases to 10 Pa. Dielectric constant and loss tangent of the films deposited at 10 Pa are 185 and 0.0008 at 10 kHz, respectively. The dielectric tunability is about 10% at a dc bias field of 0.9 MV/cm.

Original languageEnglish
Pages (from-to)1861-1866
Number of pages6
JournalApplied Surface Science
Volume256
Issue number6
DOIs
StatePublished - 1 Jan 2010
Externally publishedYes

Keywords

  • BZN thin films
  • Dielectric properties
  • Oxygen pressure
  • Pulsed laser deposition
  • Tunability

Fingerprint

Dive into the research topics of 'Effect of oxygen pressure on structure and properties of Bi 1.5 Zn 1.0 Nb 1.5 O 7 pyrochlore thin films prepared by pulsed laser deposition'. Together they form a unique fingerprint.

Cite this