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Effect of N2 partial pressure on the microstructure and properties of Nb-Si-N films

  • Xi'an Jiaotong University
  • Lanzhou Jiaotong University

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

The Nb-Si-N films were deposited by reactive magnetron sputtering with different N2 partial pressures. The result showed that the composition, microstructure and properties of the Nb-Si-N films depend strongly on the N2 partial pressure. As the N2 partial pressure increasing, the Nb/Si ratio and the surface roughness decease, but the bulk resistance and microhardness of the Nb-Si-N films increase. The microstructure of Nb-Si-N films is a nano-composite structure consisting of nano-sized NbN crystallites and amorphous Si3N4-like compound of Si-N. With the increase of N2 partial pressure, the amorphous tendency of Nb-Si-N films increases and the grain size decreases.

Original languageEnglish
Pages (from-to)978-981
Number of pages4
JournalXiyou Jinshu Cailiao Yu Gongcheng/Rare Metal Materials and Engineering
Volume35
Issue number6
StatePublished - Jun 2006

Keywords

  • Magnetron sputtering
  • Microstructure
  • N partial pressure
  • Nb-Si-N

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