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Dielectric property analysis for the different charge defects in SiO2 based on the first principles

  • Xiaojun Xie
  • , Yonghong Cheng
  • , Kai Wu
  • , Xiaolin Chen
  • , Mang Li
  • , Lili Jiang
  • , Caixin Sun
  • Xi'an Jiaotong University

Research output: Contribution to conferencePaperpeer-review

1 Scopus citations

Abstract

In this paper, we establish the different defects species and the different charge states models, including the intrinsic and extrinsic defects, in the α-quartz system. The models for different defects have been optimized within the first principles. Furthermore, the formation energies for defect structures in the α-quartz system have been computed. We can deduce the easiest generated defect in the α-quartz system through the formation energies as a function of the Fermi level. From the simulation results, it is concluded that Al3+-Na+ defect is the most possible defect type at the low temperature, and then at the high temperature, the interstitial O2- is the most possible defect type. Finally from the band structure, we also find that the interstitial O2- and Al 3+-Na+ defect are the shallow defect level in the energy band. And they become the very important accept defects in α-quartz.

Original languageEnglish
Pages526-529
Number of pages4
DOIs
StatePublished - 2008
Event2008 International Symposium on Electrical Insulating Materials, ISEIM 2008 - Yokkaichi, Japan
Duration: 7 Sep 200811 Sep 2008

Conference

Conference2008 International Symposium on Electrical Insulating Materials, ISEIM 2008
Country/TerritoryJapan
CityYokkaichi
Period7/09/0811/09/08

Keywords

  • Defect
  • Density functional theory
  • Dielectric property
  • Formation energy
  • Quartz

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