Dielectric behavior of TiO2 ceramic prepared by plasma activated sintering

  • Guiwu Liu
  • , Wenzheng Jian
  • , Haiyun Jin
  • , Zhongqi Shi
  • , Guanjun Qiao

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

Rutile-phase TiO2 ceramic was rapidly fabricated by plasma activated sintering (PAS) at 650-850 °C for 3 min under 30 MPa. The temperature and frequency dependences of the dielectric properties (dielectric constant and dielectric loss) for the dense TiO2 ceramic were investigated, and the dielectric behavior was briefly discussed. It was demonstrated that extraordinarily high dielectric constant (2-5×10 4) was observed in the whole experimental ranges of-160 to 200 °C and 1 kHz-1 MHz. Moreover, the dielectric loss kept a relatively normal level, however, its temperature and frequency dependences were markedly different with those of the rutile-phase TiO2 preforms. The unusual dielectric behavior was related with the particular dielectric polarizations of the TiO2 ceramic and its dominant form of loss under different conditions.

Original languageEnglish
Pages (from-to)3468-3471
Number of pages4
JournalMaterials Letters
Volume65
Issue number23-24
DOIs
StatePublished - Dec 2011

Keywords

  • Density
  • Dielectric properties
  • Microstructure
  • Plasma activated sintering

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