Abstract
Rutile-phase TiO2 ceramic was rapidly fabricated by plasma activated sintering (PAS) at 650-850 °C for 3 min under 30 MPa. The temperature and frequency dependences of the dielectric properties (dielectric constant and dielectric loss) for the dense TiO2 ceramic were investigated, and the dielectric behavior was briefly discussed. It was demonstrated that extraordinarily high dielectric constant (2-5×10 4) was observed in the whole experimental ranges of-160 to 200 °C and 1 kHz-1 MHz. Moreover, the dielectric loss kept a relatively normal level, however, its temperature and frequency dependences were markedly different with those of the rutile-phase TiO2 preforms. The unusual dielectric behavior was related with the particular dielectric polarizations of the TiO2 ceramic and its dominant form of loss under different conditions.
| Original language | English |
|---|---|
| Pages (from-to) | 3468-3471 |
| Number of pages | 4 |
| Journal | Materials Letters |
| Volume | 65 |
| Issue number | 23-24 |
| DOIs | |
| State | Published - Dec 2011 |
Keywords
- Density
- Dielectric properties
- Microstructure
- Plasma activated sintering
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