Dielectric behavior, band gap, in situ X-ray diffraction, Raman and infrared study on (1 - X)BiVO4-x(Li0.5Bi 0.5)MoO4 solid solution

  • Di Zhou
  • , Li Xia Pang
  • , Wei Guo Qu
  • , Clive A. Randall
  • , Jing Guo
  • , Ze Ming Qi
  • , Tao Shao
  • , Xi Yao

Research output: Contribution to journalArticlepeer-review

26 Scopus citations

Abstract

The phase transition in the (1 - x)BiVO4-x(Li 0.5Bi0.5)MoO4 solid solution was first confirmed by the in situ X-ray diffraction method. The merging of the (2 0 0) and (0 2 0) diffraction peaks in the X-ray diffraction data, and the overlapping of the δs(VO4) and δas(VO 4) modes for Raman and Infrared spectra of x = 0.06 sample were observed at 110-115 °C. The splitting of infrared bands at around 325 cm-1 for x = 0.125 sample was revealed at -10 °C. The dielectric permittivity peaks as a function of temperature can be observed at high frequencies (>10 kHz), which is corresponding to the ferroelastic phase transition. In the monoclinic solid solution region, the band gaps were found to lie between 2.2-2.35 eV a range of interest as photo-catalytic materials.

Original languageEnglish
Pages (from-to)5009-5014
Number of pages6
JournalRSC Advances
Volume3
Issue number15
DOIs
StatePublished - 21 Apr 2013

Fingerprint

Dive into the research topics of 'Dielectric behavior, band gap, in situ X-ray diffraction, Raman and infrared study on (1 - X)BiVO4-x(Li0.5Bi 0.5)MoO4 solid solution'. Together they form a unique fingerprint.

Cite this