Development of testing device for critical current measurements for hts/lts

Qiuliang Wang; Yinming Dai; Baozhi Zhao; Shousen Song; Zhiqiang Cao; Shunzhong Chen; Quan Zhang; Housheng Wang; Junsheng Cheng; Yuanzhong Lei; Bai Ye; Xian Li; Jianhua Liu; Shangwu Zhao; Hongjie Zhang; Xinning Hu; Chunzhong Wang; Luguang Yan; Keeman Kim

doi:10.1109/TASC.2009.2018415

Development of testing device for critical current _{measurements for hts/lts}

Qiuliang Wang
, Yinming Dai
, Baozhi Zhao
, Shousen Song
, Zhiqiang Cao
, Shunzhong Chen
, Quan Zhang
, Housheng Wang
, Junsheng Cheng
, Yuanzhong Lei
, Bai Ye
, Xian Li
, Jianhua Liu
, Shangwu Zhao
, Hongjie Zhang
, Xinning Hu
, Chunzhong Wang
, Luguang Yan
, Keeman Kim

School of Electrical Engineering

CAS - Institute of Electrical Engineering
National Fusion Research Institute

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

For the goal of superconducting magnet applications in the advanced testing device for high temperature superconducting (HTS) wire and sample coils, a wide bore conduction-cooled superconducting magnet with available warm bore of ø186 mm and center field of 5 T for the background magnetic field applications was designed and fabricated and tested. A sample cryostat with two GM cryocoolers is inserted in the background magnet. The system allows measurements to be performed in a repeatable and reliable fashion. The detailed design, fabrication and thermal analysis are presented in the paper.

Original language	English
Article number	5153098
Pages (from-to)	2325-2328
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	19
Issue number	3
DOIs	https://doi.org/10.1109/TASC.2009.2018415
State	Published - Jun 2009

Keywords

Conduction-cooled superconducting magnet
Electro-plastic model
HTS test devices

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10.1109/TASC.2009.2018415

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Wang, Q., Dai, Y., Zhao, B., Song, S., Cao, Z., Chen, S., Zhang, Q., Wang, H., Cheng, J., Lei, Y., Ye, B., Li, X., Liu, J., Zhao, S., Zhang, H., Hu, X., Wang, C., Yan, L., & Kim, K. (2009). Development of testing device for critical current _{measurements for hts/lts}. IEEE Transactions on Applied Superconductivity, 19(3), 2325-2328. Article 5153098. https://doi.org/10.1109/TASC.2009.2018415

@article{0fd3e0953fee44529ced99806f356b9c,

title = "Development of testing device for critical current measurements for hts/lts",

abstract = "For the goal of superconducting magnet applications in the advanced testing device for high temperature superconducting (HTS) wire and sample coils, a wide bore conduction-cooled superconducting magnet with available warm bore of {\o}186 mm and center field of 5 T for the background magnetic field applications was designed and fabricated and tested. A sample cryostat with two GM cryocoolers is inserted in the background magnet. The system allows measurements to be performed in a repeatable and reliable fashion. The detailed design, fabrication and thermal analysis are presented in the paper.",

keywords = "Conduction-cooled superconducting magnet, Electro-plastic model, HTS test devices",

author = "Qiuliang Wang and Yinming Dai and Baozhi Zhao and Shousen Song and Zhiqiang Cao and Shunzhong Chen and Quan Zhang and Housheng Wang and Junsheng Cheng and Yuanzhong Lei and Bai Ye and Xian Li and Jianhua Liu and Shangwu Zhao and Hongjie Zhang and Xinning Hu and Chunzhong Wang and Luguang Yan and Keeman Kim",

year = "2009",

month = jun,

doi = "10.1109/TASC.2009.2018415",

language = "英语",

volume = "19",

pages = "2325--2328",

journal = "IEEE Transactions on Applied Superconductivity",

issn = "1051-8223",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "3",

}

Wang, Q, Dai, Y, Zhao, B, Song, S, Cao, Z, Chen, S, Zhang, Q, Wang, H, Cheng, J, Lei, Y, Ye, B, Li, X, Liu, J, Zhao, S, Zhang, H, Hu, X, Wang, C, Yan, L & Kim, K 2009, 'Development of testing device for critical current _{measurements for hts/lts}', IEEE Transactions on Applied Superconductivity, vol. 19, no. 3, 5153098, pp. 2325-2328. https://doi.org/10.1109/TASC.2009.2018415

TY - JOUR

T1 - Development of testing device for critical current measurements for hts/lts

AU - Wang, Qiuliang

AU - Dai, Yinming

AU - Zhao, Baozhi

AU - Song, Shousen

AU - Cao, Zhiqiang

AU - Chen, Shunzhong

AU - Zhang, Quan

AU - Wang, Housheng

AU - Cheng, Junsheng

AU - Lei, Yuanzhong

AU - Ye, Bai

AU - Li, Xian

AU - Liu, Jianhua

AU - Zhao, Shangwu

AU - Zhang, Hongjie

AU - Hu, Xinning

AU - Wang, Chunzhong

AU - Yan, Luguang

AU - Kim, Keeman

PY - 2009/6

Y1 - 2009/6

N2 - For the goal of superconducting magnet applications in the advanced testing device for high temperature superconducting (HTS) wire and sample coils, a wide bore conduction-cooled superconducting magnet with available warm bore of ø186 mm and center field of 5 T for the background magnetic field applications was designed and fabricated and tested. A sample cryostat with two GM cryocoolers is inserted in the background magnet. The system allows measurements to be performed in a repeatable and reliable fashion. The detailed design, fabrication and thermal analysis are presented in the paper.

AB - For the goal of superconducting magnet applications in the advanced testing device for high temperature superconducting (HTS) wire and sample coils, a wide bore conduction-cooled superconducting magnet with available warm bore of ø186 mm and center field of 5 T for the background magnetic field applications was designed and fabricated and tested. A sample cryostat with two GM cryocoolers is inserted in the background magnet. The system allows measurements to be performed in a repeatable and reliable fashion. The detailed design, fabrication and thermal analysis are presented in the paper.

KW - Conduction-cooled superconducting magnet

KW - Electro-plastic model

KW - HTS test devices

UR - https://www.scopus.com/pages/publications/68749119367

U2 - 10.1109/TASC.2009.2018415

DO - 10.1109/TASC.2009.2018415

M3 - 文章

AN - SCOPUS:68749119367

SN - 1051-8223

VL - 19

SP - 2325

EP - 2328

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

IS - 3

M1 - 5153098

ER -

Development of testing device for critical current _{measurements for hts/lts}

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Keywords

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