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Detection of ion adsorption at solid-liquid interfaces using internal reflection ellipsometry

  • Lei Wang
  • , Cunlu Zhao
  • , Michel H.G. Duits
  • , Frieder Mugele
  • , Igor Siretanu
  • University of Twente

Research output: Contribution to journalArticlepeer-review

36 Scopus citations

Abstract

We use imaging internal reflection ellipsometry (IRE) in combination with a microfluidic device to study the adsorption of inorganic salt ions to silica-water interfaces. In our data analysis, the measured polarization-dependent reflectivity is compared to calculations from a layer stack model, where the electric double layer is modeled as a separate layer. Due to the high resolution of our technique, we are able to quantify the adsorption of Na+ and Ca2+ ions from aqueous solutions of their chloride salts as a function of their bulk concentrations at pH 3 and 10. Our measurements demonstrate a preferential adsorption of Ca2+ counterions. The experimental results are well described by calculations using a triple layer surface complexation model for the electric double layer with published equilibrium constants.

Original languageEnglish
Pages (from-to)649-655
Number of pages7
JournalSensors and Actuators B: Chemical
Volume210
DOIs
StatePublished - Apr 2015
Externally publishedYes

Keywords

  • Electric double layer
  • Internal reflection ellipsometry
  • Ion adsorption
  • Surface complexation reactions

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