TY - CHAP
T1 - Detection and identification of bias faults in nonlinear system
AU - Zhang, Youmin
AU - Li, X. Rong
AU - Yang, Xuedong
AU - Zhang, Hongcai
PY - 1996
Y1 - 1996
N2 - Although fault detection and identification (FDI) methods for linear systems have been developed extensively, FDI for nonlinear systems still deserves much attention. In order to detect bias type faults, a bias χ2 FDI method is proposed here on the basis of the pseudo separated-bias estimation (PSBE) algorithm. Estimates of biases obtained by PSBE are used to construct a statistical variable which obeys χ2 distribution in normal operational conditions. As a result, by testing if the constructed variable is χ2 distributed at every estimation step, one can detect input-output bias faults quickly. In order to identify where a bias fault occurs, a bias component χ2 detection scheme is proposed further. Simulation results of a paper machine illustrate the effectiveness of the method for real-time application.
AB - Although fault detection and identification (FDI) methods for linear systems have been developed extensively, FDI for nonlinear systems still deserves much attention. In order to detect bias type faults, a bias χ2 FDI method is proposed here on the basis of the pseudo separated-bias estimation (PSBE) algorithm. Estimates of biases obtained by PSBE are used to construct a statistical variable which obeys χ2 distribution in normal operational conditions. As a result, by testing if the constructed variable is χ2 distributed at every estimation step, one can detect input-output bias faults quickly. In order to identify where a bias fault occurs, a bias component χ2 detection scheme is proposed further. Simulation results of a paper machine illustrate the effectiveness of the method for real-time application.
UR - https://www.scopus.com/pages/publications/0030406145
M3 - 章节
AN - SCOPUS:0030406145
T3 - Proceedings of the IEEE Conference on Decision and Control
BT - Proceedings of the IEEE Conference on Decision and Control
A2 - Anon, null
T2 - Proceedings of the 1996 35th IEEE Conference on Decision and Control. Part 3 (of 4)
Y2 - 11 December 1996 through 13 December 1996
ER -