TY - GEN
T1 - Deformation kinetics in Cu/Ta nanoscale multilayers
AU - Wang, F.
AU - Huang, P.
AU - Xu, M.
AU - Lu, T. J.
PY - 2010
Y1 - 2010
N2 - Intensive research has been carried out on two key parameters important for interpreting the deformation kinetics of nanocrystalline metals, i.e., strain rate sensitivity and activation volume. Other than nanocrystalline metals, however, only a few recent studies focus on evaluating the two parameters for nanoscale multilayers that also possess nanoscale grain size. Using transmission electron microscope and nanoindentation test, we study the deformation behavior of nanoscale Cu/Ta multilayers having modulation period of 140 nm and 18 nm, respectively. The microstructure, grain size and strain rate sensitivity of the nanoscale multilayer subjected to nanoindentation are examined to explore its deformation mechanisms. It is established that the strain rate sensitivity of nanoscale Cu/Ta multilayers differ from those of nanocrystalline metals. The implications of these findings for the mechanical properties of nanoscale multilayers are discussed.
AB - Intensive research has been carried out on two key parameters important for interpreting the deformation kinetics of nanocrystalline metals, i.e., strain rate sensitivity and activation volume. Other than nanocrystalline metals, however, only a few recent studies focus on evaluating the two parameters for nanoscale multilayers that also possess nanoscale grain size. Using transmission electron microscope and nanoindentation test, we study the deformation behavior of nanoscale Cu/Ta multilayers having modulation period of 140 nm and 18 nm, respectively. The microstructure, grain size and strain rate sensitivity of the nanoscale multilayer subjected to nanoindentation are examined to explore its deformation mechanisms. It is established that the strain rate sensitivity of nanoscale Cu/Ta multilayers differ from those of nanocrystalline metals. The implications of these findings for the mechanical properties of nanoscale multilayers are discussed.
UR - https://www.scopus.com/pages/publications/84881402065
U2 - 10.1115/IMECE2010-37483
DO - 10.1115/IMECE2010-37483
M3 - 会议稿件
AN - SCOPUS:84881402065
SN - 9780791844465
T3 - ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)
SP - 631
EP - 643
BT - ASME 2010 International Mechanical Engineering Congress and Exposition, IMECE 2010
PB - American Society of Mechanical Engineers (ASME)
T2 - ASME 2010 International Mechanical Engineering Congress and Exposition, IMECE 2010
Y2 - 12 November 2010 through 18 November 2010
ER -