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Deformation and removal characteristics of multilayered thin film structures in nanoscratching and diamond lapping

  • University of Queensland

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The deformation and removal mechanism of a multilayered thin film structure involved in nanoscratching and diamond lapping processes were investigated. The results obtained from the two processes were compared, in terms of deformation characteristics and surface finish. It was found that both nanoscratching and lapping demonstrated similar characteristics. This work provides insight into the deformation and removal of a thin film multilayered structure undermechanical loading, and thus the outcome is of value for developing the efficient machining process for such structures.

Original languageEnglish
Title of host publicationAdvances in Abrasive Technology XVII
EditorsJiwang Yan, Hideki Aoyama, Akinori Yui
PublisherTrans Tech Publications Ltd
Pages61-65
Number of pages5
ISBN (Electronic)9783038352211
DOIs
StatePublished - 2014
Externally publishedYes
Event17th International Symposium on Advances in Abrasive Technology, ISAAT 2014 - Kailua, United States
Duration: 22 Sep 201425 Sep 2014

Publication series

NameAdvanced Materials Research
Volume1017
ISSN (Print)1022-6680
ISSN (Electronic)1662-8985

Conference

Conference17th International Symposium on Advances in Abrasive Technology, ISAAT 2014
Country/TerritoryUnited States
CityKailua
Period22/09/1425/09/14

Keywords

  • Deformation
  • Lapping
  • Multilayer
  • Nanoscratch
  • Removal
  • Thin film

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