Datasheet-Driven Non-segmented SPICE Model of SiC MOSFET With Improved Accuracy

  • Ziqi Jia
  • , Yu Jiang
  • , Yifan Hu
  • , Hailong He
  • , Chunping Niu
  • , Yi Wu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In recent years, SiC MOSFETs have experienced rapid advancements, driven by the growing demand for high-efficiency power devices in applications such as electric vehicles, renewable energy, and industrial automation. To achieve more accurate circuit simulations, a precise and robust SPICE model is essential. Although device manufacturers usually provide simplified SPICE models, the accuracy is insufficient to meet the simulation requirements. This paper proposes a data table-driven compact model for SiC MOSFETs, in which both static and C-V characteristics are accurately described by non-segment equations. Compared to the SPICE models provided by manufacturers, the model is characterized by the use of non-piecewise equations to describe its behavior, which enhances its convergence in simulations. Additionally, considering the different characteristics between high current and low current regions, the original EKV model is modified to improve the accuracy, and the third quadrant characteristics are modeled independently, making it more consistent with the device's actual behavior in practical circuits.

Original languageEnglish
Title of host publication2025 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia, WiPDA Asia 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331511098
DOIs
StatePublished - 2025
Event2025 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia, WiPDA Asia 2025 - Beijing, China
Duration: 15 Aug 202517 Aug 2025

Publication series

Name2025 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia, WiPDA Asia 2025

Conference

Conference2025 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia, WiPDA Asia 2025
Country/TerritoryChina
CityBeijing
Period15/08/2517/08/25

Keywords

  • Convergence ability
  • modified EKV
  • parasitic capacitance
  • SiC MOSFET
  • SPICE model

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