Crystal structure and electrical transport properties of polycrystalline TbMn1-xFexO3

  • S. L. Wang
  • , P. G. Li
  • , Y. H. Zou
  • , X. P. Wu
  • , G. Ungar
  • , Y. S. Liu
  • , J. Q. Shen
  • , W. H. Tang

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Polycrystalline TbMn1-xFexO3 (x=0, 0.1, 0.3, 0.5, 0.7, 0.9, 1) were synthesized by solid sintering method. The Rietveld refinement results based on the X-ray powder diffraction (XRD) data showed that all samples were identified as orthorhombic perovskite structure with space group Pbnm (62). The lattice parameters a and c increased, while the b decreased with increasing of Fe content, indicating the crystal unit cell shrinks in the ab-plane and extends along c-axis with increasing concentration of Fe. Temperature dependent resistance (R-T) was also measured. The transition temperature of TbMn1-xFexO3 samples increased monotonically with increase of x. The activation energy of TbMn1-xFexO3 decreased with increasing Fe content (x≤0.5) and increased with increasing Fe content when x>0.5, meaning that the TbMn0.5Fe0.5O3 has the lowest activation energy. These results implied that the transition temperature and conductivity could be controlled by impuring different elements, especially to obtained better performance as for the semiconductor materials working at broad temperature.

Original languageEnglish
Pages (from-to)81-85
Number of pages5
JournalJournal of Physics and Chemistry of Solids
Volume85
DOIs
StatePublished - 16 May 2015
Externally publishedYes

Keywords

  • Crystal structure
  • Electrical properties
  • Semiconductors
  • X-ray diffraction

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