Correntropy induced metric based common spatial patterns

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

Common spatial patterns (CSP) is a widely used method in the field of electroencephalogram (EEG) signal processing. The goal of CSP is to find spatial filters that maximize the ratio between the variances of two classes. The conventional CSP is however sensitive to outliers because it is based on the L2-norm. Inspired by the correntropy induced metric (CIM), we propose in this work a new algorithm, called CIM based CSP (CSP-CIM), to improve the robustness of CSP with respect to outliers. The CSP-CIM searches the optimal solution by a simple gradient based iterative algorithm. A toy example and a real EEG dataset are used to demonstrate the desirable performance of the new method.

Original languageEnglish
Title of host publication2017 IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2017 - Proceedings
EditorsNaonori Ueda, Jen-Tzung Chien, Tomoko Matsui, Jan Larsen, Shinji Watanabe
PublisherIEEE Computer Society
Pages1-6
Number of pages6
ISBN (Electronic)9781509063413
DOIs
StatePublished - 5 Dec 2017
Event2017 IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2017 - Tokyo, Japan
Duration: 25 Sep 201728 Sep 2017

Publication series

NameIEEE International Workshop on Machine Learning for Signal Processing, MLSP
Volume2017-September
ISSN (Print)2161-0363
ISSN (Electronic)2161-0371

Conference

Conference2017 IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2017
Country/TerritoryJapan
CityTokyo
Period25/09/1728/09/17

Keywords

  • Common spatial patterns
  • Correntropy induced metric
  • Kernel bandwidth
  • Robustness

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