Computable Bulk and Interfacial Electronic Structure Features as Proxies for Dielectric Breakdown of Polymers

Breakdown strength, the maximum electric field that can be applied on a dielectric polymer without destroying its insulating characteristics, sets an upper limit on the maximum energy that can be stored in this material. Despite its significance, the breakdown strength remains poorly understood and impractical to compute. This is a major challenge in the development of high-energy dielectric polymers for which a large number of candidates must be screened for identifying those with high breakdown strength. In this work, we develop a multistep strategy for accessing the breakdown strength through two proxies that can be computationally estimated in a high-Throughput manner, i.e., the polymer band gap and electron injection barrier at electrode-polymer interfaces. First, these properties are experimentally proven (established) to be correlated strongly with the breakdown strength of a number of benchmark polymers. Then, we develop a simple model, which relies on the chain structure of polymers, to estimate their band gap and electron injection barrier at the level of density functional theory. After validation, this model was finally used for 990 polymers, identifying 53 candidates that have preferable proxies, and thus, potentially having high breakdown strength. Because of the past synthesizability evidence of these polymers, we hope that they may be considered to be synthesized and tested in the near future. Moreover, some empirical rules that were extracted from our computed data could be useful for polymer selection and design in general. We note that the strategy used here is generic and can be used to design materials with other attractive, but complex, properties as well.