Comparison between two device structures of SPR enhanced UV detectors based on ZnO

Gaoming Li; Jingwen Zhang; Guangde Chen; Xun Hou

doi:10.1051/epjap/2017170196

Comparison between two device structures of SPR enhanced UV detectors based on ZnO

Gaoming Li
, Jingwen Zhang
, Guangde Chen
, Xun Hou

Faculty of Electronic and Information Engineering

Xi'an Jiaotong University

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Surface plasmon resonance can be exploited to greatly enhance the photo response of photo detectors. The enhancement is highly dependent on the device structure of the detector. In this paper, we compared two types of SPR enhanced UV detectors based on ZnO in terms of fabrication process, absorption, I-V curves, and spectral response. The peak responsivity is enlarged by 22-100 times due to SPR enhancement. The embedding type detector has an advantage in dark current controlling. However, the surface type detector has a simpler fabrication process and more importantly a more prominent responsivity enhancement. Therefore, the surface type is a more favourable structure to incorporate SPR with ZnO UV detectors to realize large enhancement of responsivity.

Original language	English
Article number	10102
Journal	EPJ Applied Physics
Volume	80
Issue number	1
DOIs	https://doi.org/10.1051/epjap/2017170196
State	Published - 1 Oct 2017

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title = "Comparison between two device structures of SPR enhanced UV detectors based on ZnO",

abstract = "Surface plasmon resonance can be exploited to greatly enhance the photo response of photo detectors. The enhancement is highly dependent on the device structure of the detector. In this paper, we compared two types of SPR enhanced UV detectors based on ZnO in terms of fabrication process, absorption, I-V curves, and spectral response. The peak responsivity is enlarged by 22-100 times due to SPR enhancement. The embedding type detector has an advantage in dark current controlling. However, the surface type detector has a simpler fabrication process and more importantly a more prominent responsivity enhancement. Therefore, the surface type is a more favourable structure to incorporate SPR with ZnO UV detectors to realize large enhancement of responsivity.",

author = "Gaoming Li and Jingwen Zhang and Guangde Chen and Xun Hou",

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AU - Li, Gaoming

AU - Zhang, Jingwen

AU - Chen, Guangde

AU - Hou, Xun

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Y1 - 2017/10/1

N2 - Surface plasmon resonance can be exploited to greatly enhance the photo response of photo detectors. The enhancement is highly dependent on the device structure of the detector. In this paper, we compared two types of SPR enhanced UV detectors based on ZnO in terms of fabrication process, absorption, I-V curves, and spectral response. The peak responsivity is enlarged by 22-100 times due to SPR enhancement. The embedding type detector has an advantage in dark current controlling. However, the surface type detector has a simpler fabrication process and more importantly a more prominent responsivity enhancement. Therefore, the surface type is a more favourable structure to incorporate SPR with ZnO UV detectors to realize large enhancement of responsivity.

AB - Surface plasmon resonance can be exploited to greatly enhance the photo response of photo detectors. The enhancement is highly dependent on the device structure of the detector. In this paper, we compared two types of SPR enhanced UV detectors based on ZnO in terms of fabrication process, absorption, I-V curves, and spectral response. The peak responsivity is enlarged by 22-100 times due to SPR enhancement. The embedding type detector has an advantage in dark current controlling. However, the surface type detector has a simpler fabrication process and more importantly a more prominent responsivity enhancement. Therefore, the surface type is a more favourable structure to incorporate SPR with ZnO UV detectors to realize large enhancement of responsivity.

UR - https://www.scopus.com/pages/publications/85030540265

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DO - 10.1051/epjap/2017170196

M3 - 文章

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VL - 80

JO - EPJ Applied Physics

JF - EPJ Applied Physics

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ER -

Comparison between two device structures of SPR enhanced UV detectors based on ZnO

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