Abstract
The energy spectrum of the developed sandwich chemical vapor deposition (CVD) diamond film detector to alpha-particles, has been measured by experiments at room temperature, for 241Am source with a characteristic energy of 5.485 MeV and 243Am and 244Cm source with characteristic energies of 5.275 MeV and 5.805 MeV respectively. The trend of the charge collection efficiency changing with biased voltage was obtained, and the mean efficiency under different biased voltages and that at 10% of the trailing edge of the spectrum were also calculated. Results show that the performance of the detector is steady, and the charge collection efficiency of the detector to alpha-particles increases with the biased voltage increasing and is saturated at a certain biased voltage. The saturated mean charge collection efficiency can be 33.5%, and can reach 57% when calculated at the 10% of the trailing edge.
| Original language | English |
|---|---|
| Pages (from-to) | 1083-1087 |
| Number of pages | 5 |
| Journal | Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams |
| Volume | 21 |
| Issue number | 7 |
| State | Published - Jul 2009 |
| Externally published | Yes |
Keywords
- Charge collection efficiency
- Chemical vapor deposition
- Diamond film
- Particle detect
- Radiation measurement
- Semiconductor detector
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