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Challenges and recent advances in estimation performance evaluation

  • University of New Orleans

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Existing methods and metrics for estimation performance evaluation have serious limitations. They are narrowly focused, overly pessimistic, hyper sensitive to evaluation scenario, totally reliant on knowing the ground truth, and may ignore crucial coupling between the estimate and estimatee. Three challenges have been articulated: development of a comprehensive metric of estimation performance, evaluation of estimation performance without the need to know the ground truth, and development of alternative methods and measures for estimation performance ranking. A general approach to comprehensive evaluation of estimation performance without the need to know the ground truth is possible. Such an approach has been developed and is outlined here. Various metrics in three classes have been proposed recently: absolute metrics, relative metrics, and frequency counts. Having distinctive pros and cons, they should take over the widely used RMSE in many cases. Three other classes of metrics have been developed: error spectrum, desirability metrics, and concentration measures. They are much more comprehensive than existing ones. The use of a common performance measure is not the only yardstick for performance ranking. Alternatives do exist and may prove superior. A viable one is to rank by outcomes of competitions among estimators. Two measures in this category have been proposed and a third class is under development.

Original languageEnglish
Title of host publicationSignal Processing, Sensor Fusion, and Target Recognition XVII
Pageslii-lvii
DOIs
StatePublished - 2008
Externally publishedYes
EventThe International Society for Optical Engineering (SPIE) - Orlando, FL, United States
Duration: 17 Mar 200819 Mar 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6968
ISSN (Print)0277-786X

Conference

ConferenceThe International Society for Optical Engineering (SPIE)
Country/TerritoryUnited States
CityOrlando, FL
Period17/03/0819/03/08

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