TY - GEN
T1 - Capacitor Damage-Based Power Routing Strategy in ISOP-DAB Converters for Smart Grid
AU - Liu, Xue
AU - Zhang, Yan
AU - Cao, Rui
AU - Li, Yang
AU - Lv, Chunlin
AU - Liu, Jinjun
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021/5/24
Y1 - 2021/5/24
N2 - The solid-state transformer (SST) is gaining popularity in smart grid for its high flexibility and high controllability. However, the application is limited by its low reliability and the required high maintenance costs. To improve the system reliability and optimize the maintenance schedules, power routing has been widely studied recently. Most power routing strategies allocate power among cells based only on power semiconductor devices (PSDs) damage, but ignore capacitors, another key component in power electronic converters, which may greatly weaken the ability of power routing to converge the lifetimes of cells and reduce the number of maintenances. To analyze the influence of capacitors on power routing, this paper has compared PSD damage-based power routing with the power routing strategy considering both the damage of capacitors and PSDs for the input-series-output-parallel (ISOP) connected dual active bridge (DAB) converter, and found that capacitors wear out much faster than PSDs. Therefore, a capacitor damage-based power routing strategy is proposed for the system where capacitors dominate its reliability. It can achieve the same effect as the power routing strategy considering both capacitors and PSDs, while balancing accuracy and computation time, and greatly reducing the hardware complexity. Validity of the proposed strategy is verified by simulation in MATLAB.
AB - The solid-state transformer (SST) is gaining popularity in smart grid for its high flexibility and high controllability. However, the application is limited by its low reliability and the required high maintenance costs. To improve the system reliability and optimize the maintenance schedules, power routing has been widely studied recently. Most power routing strategies allocate power among cells based only on power semiconductor devices (PSDs) damage, but ignore capacitors, another key component in power electronic converters, which may greatly weaken the ability of power routing to converge the lifetimes of cells and reduce the number of maintenances. To analyze the influence of capacitors on power routing, this paper has compared PSD damage-based power routing with the power routing strategy considering both the damage of capacitors and PSDs for the input-series-output-parallel (ISOP) connected dual active bridge (DAB) converter, and found that capacitors wear out much faster than PSDs. Therefore, a capacitor damage-based power routing strategy is proposed for the system where capacitors dominate its reliability. It can achieve the same effect as the power routing strategy considering both capacitors and PSDs, while balancing accuracy and computation time, and greatly reducing the hardware complexity. Validity of the proposed strategy is verified by simulation in MATLAB.
KW - ISOP-DAB converter
KW - power routing
KW - reliability
UR - https://www.scopus.com/pages/publications/85114207116
U2 - 10.1109/ECCE-Asia49820.2021.9479123
DO - 10.1109/ECCE-Asia49820.2021.9479123
M3 - 会议稿件
AN - SCOPUS:85114207116
T3 - Proceedings of the Energy Conversion Congress and Exposition - Asia, ECCE Asia 2021
SP - 1783
EP - 1788
BT - Proceedings of the Energy Conversion Congress and Exposition - Asia, ECCE Asia 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 12th IEEE Energy Conversion Congress and Exposition - Asia, ECCE Asia 2021
Y2 - 24 May 2021 through 27 May 2021
ER -
