TY - JOUR
T1 - Broad-Band Ultra-Low-Reflectivity Multiscale Micro-Nano Structures by the Combination of Femtosecond Laser Ablation and in Situ Deposition
AU - Chen, Tong
AU - Wang, Wenjun
AU - Tao, Tao
AU - Pan, Aifei
AU - Mei, Xuesong
N1 - Publisher Copyright:
© 2020 American Chemical Society.
PY - 2020/10/28
Y1 - 2020/10/28
N2 - Functional surfaces with broad-band ultralow optical reflection have many potential applications in areas like national defense and energy conversion. For efficient, high-quality manufacturing of material surfaces with antireflection features, a novel machining method for multiscale micro-nano structures is proposed. This method can enable the collaborative manufacturing of both microstructures via laser ablation and micro-nano structures with high porosity via in situ deposition, and it can simplify the fabrication process of multiscale micro-nano structures. As a result, substantially improved antireflection properties of the treated material surface can be realized by optimizing light trapping of the microstructures and enhancing the effective medium effect for the micro-nano structures with high porosity. In ultraviolet-visible-near-infrared regions, average reflectances, as low as 2.21 and 3.33%, are achieved for Si and Cu surfaces, respectively. Furthermore, the antireflection effect of the treated surface can also be extended to the mid-infrared wavelength range, where the average reflectances for the Si and Cu surfaces decrease to 5.28 and 5.18%, respectively. This novel collaborative manufacturing method is both simple and adaptable for different materials, which opens new doors for the preparation of broad-band ultra-low-reflectivity materials.
AB - Functional surfaces with broad-band ultralow optical reflection have many potential applications in areas like national defense and energy conversion. For efficient, high-quality manufacturing of material surfaces with antireflection features, a novel machining method for multiscale micro-nano structures is proposed. This method can enable the collaborative manufacturing of both microstructures via laser ablation and micro-nano structures with high porosity via in situ deposition, and it can simplify the fabrication process of multiscale micro-nano structures. As a result, substantially improved antireflection properties of the treated material surface can be realized by optimizing light trapping of the microstructures and enhancing the effective medium effect for the micro-nano structures with high porosity. In ultraviolet-visible-near-infrared regions, average reflectances, as low as 2.21 and 3.33%, are achieved for Si and Cu surfaces, respectively. Furthermore, the antireflection effect of the treated surface can also be extended to the mid-infrared wavelength range, where the average reflectances for the Si and Cu surfaces decrease to 5.28 and 5.18%, respectively. This novel collaborative manufacturing method is both simple and adaptable for different materials, which opens new doors for the preparation of broad-band ultra-low-reflectivity materials.
KW - broad-band ultralow reflectivity
KW - femtosecond laser
KW - laser in situ deposition
KW - mid-infrared
KW - multiscale micro-nano structures
UR - https://www.scopus.com/pages/publications/85094931533
U2 - 10.1021/acsami.0c16894
DO - 10.1021/acsami.0c16894
M3 - 文章
C2 - 33064460
AN - SCOPUS:85094931533
SN - 1944-8244
VL - 12
SP - 49265
EP - 49274
JO - ACS Applied Materials and Interfaces
JF - ACS Applied Materials and Interfaces
IS - 43
ER -