TY - GEN
T1 - Beam hardening correction for fan-beam CT imaging with multiple materials
AU - Zhang, Yanbo
AU - Mou, Xuanqin
AU - Tang, Shaojie
PY - 2010
Y1 - 2010
N2 - In X-ray CT, Beam hardening (BH) effect, which is caused by polychromatic X-ray beam and energy-dependent attenuation coefficients, always introduces cupping and streak artifacts. Most of correction methods can only deal with beam hardening artifacts for a single material or dual-material object, but fail to correct in case of a multi-material object since the correction complexity and instability increase with the increase of the kinds of materials. In this paper, we proposed a multimaterial BH correction method. A binary Legendre polynomial is adopted to correct BH based on bi-parameter imaging physical model, and the Helgasson-Ludwig consistency condition (H-L consistency condition) is introduced to optimally determine the bi-parameters of all materials. In the simulation experiments showed that the proposed method can suppress the artifacts greatly. The corrected values approach very closely to the ideal ones.
AB - In X-ray CT, Beam hardening (BH) effect, which is caused by polychromatic X-ray beam and energy-dependent attenuation coefficients, always introduces cupping and streak artifacts. Most of correction methods can only deal with beam hardening artifacts for a single material or dual-material object, but fail to correct in case of a multi-material object since the correction complexity and instability increase with the increase of the kinds of materials. In this paper, we proposed a multimaterial BH correction method. A binary Legendre polynomial is adopted to correct BH based on bi-parameter imaging physical model, and the Helgasson-Ludwig consistency condition (H-L consistency condition) is introduced to optimally determine the bi-parameters of all materials. In the simulation experiments showed that the proposed method can suppress the artifacts greatly. The corrected values approach very closely to the ideal ones.
UR - https://www.scopus.com/pages/publications/79960301503
U2 - 10.1109/NSSMIC.2010.5874473
DO - 10.1109/NSSMIC.2010.5874473
M3 - 会议稿件
AN - SCOPUS:79960301503
SN - 9781424491063
T3 - IEEE Nuclear Science Symposium Conference Record
SP - 3566
EP - 3570
BT - IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
T2 - 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Y2 - 30 October 2010 through 6 November 2010
ER -