Atomic structures of planar defects in 0.95(Na0.5Bi0.5)TiO3-0.05BaTiO3 lead-free piezoelectric thin films

Shao Bo Mi; Xiao Wei Jin; Sheng Cheng; Ming Liu; Lu Lu; Chun Lin Jia

doi:10.1016/j.jallcom.2015.02.158

Atomic structures of planar defects in 0.95(Na_0.5Bi_0.5)TiO₃-0.05BaTiO₃ lead-free piezoelectric thin films

Shao Bo Mi
, Xiao Wei Jin
, Sheng Cheng
, Ming Liu
, Lu Lu
, Chun Lin Jia

Faculty of Electronic and Information Engineering

Research output: Contribution to journal › Letter › peer-review

7 Scopus citations

Abstract

Two types of planar defects are found in 0.95(Na_0.5Bi_0.5)TiO₃-0.05BaTiO₃ lead-free piezoelectric thin films prepared on polycrystalline Ni metal substrates. The atomic structures of these defects are characterized by means of aberration-corrected scanning transmission electron microscopy. The first type of planar defects is related to the (Bi₂O₂)²⁺ layers parallel to (1 0 0) plane of thin films. The second type of planar defects is determined as complex planar defects made up of edge-sharing TiO₆ octahedra with the Bi cations residing in the cavities formed by the octahedral network. The formation of the Bi-rich defects is believed to affect the physical properties of the thin films.

Original language	English
Pages (from-to)	183-186
Number of pages	4
Journal	Journal of Alloys and Compounds
Volume	636
DOIs	https://doi.org/10.1016/j.jallcom.2015.02.158
State	Published - 5 Jul 2015

Keywords

Keywords Piezoelectric film Planar defect
Microstructure
Scanning transmission electron microscopy

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10.1016/j.jallcom.2015.02.158

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title = "Atomic structures of planar defects in 0.95(Na0.5Bi0.5)TiO3-0.05BaTiO3 lead-free piezoelectric thin films",

abstract = "Two types of planar defects are found in 0.95(Na0.5Bi0.5)TiO3-0.05BaTiO3 lead-free piezoelectric thin films prepared on polycrystalline Ni metal substrates. The atomic structures of these defects are characterized by means of aberration-corrected scanning transmission electron microscopy. The first type of planar defects is related to the (Bi2O2)2+ layers parallel to (1 0 0) plane of thin films. The second type of planar defects is determined as complex planar defects made up of edge-sharing TiO6 octahedra with the Bi cations residing in the cavities formed by the octahedral network. The formation of the Bi-rich defects is believed to affect the physical properties of the thin films.",

keywords = "Keywords Piezoelectric film Planar defect, Microstructure, Scanning transmission electron microscopy",

author = "Mi, \{Shao Bo\} and Jin, \{Xiao Wei\} and Sheng Cheng and Ming Liu and Lu Lu and Jia, \{Chun Lin\}",

note = "Publisher Copyright: {\textcopyright} 2015 Elsevier B.V.",

year = "2015",

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doi = "10.1016/j.jallcom.2015.02.158",

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TY - JOUR

T1 - Atomic structures of planar defects in 0.95(Na0.5Bi0.5)TiO3-0.05BaTiO3 lead-free piezoelectric thin films

AU - Mi, Shao Bo

AU - Jin, Xiao Wei

AU - Cheng, Sheng

AU - Liu, Ming

AU - Lu, Lu

AU - Jia, Chun Lin

PY - 2015/7/5

Y1 - 2015/7/5

N2 - Two types of planar defects are found in 0.95(Na0.5Bi0.5)TiO3-0.05BaTiO3 lead-free piezoelectric thin films prepared on polycrystalline Ni metal substrates. The atomic structures of these defects are characterized by means of aberration-corrected scanning transmission electron microscopy. The first type of planar defects is related to the (Bi2O2)2+ layers parallel to (1 0 0) plane of thin films. The second type of planar defects is determined as complex planar defects made up of edge-sharing TiO6 octahedra with the Bi cations residing in the cavities formed by the octahedral network. The formation of the Bi-rich defects is believed to affect the physical properties of the thin films.

AB - Two types of planar defects are found in 0.95(Na0.5Bi0.5)TiO3-0.05BaTiO3 lead-free piezoelectric thin films prepared on polycrystalline Ni metal substrates. The atomic structures of these defects are characterized by means of aberration-corrected scanning transmission electron microscopy. The first type of planar defects is related to the (Bi2O2)2+ layers parallel to (1 0 0) plane of thin films. The second type of planar defects is determined as complex planar defects made up of edge-sharing TiO6 octahedra with the Bi cations residing in the cavities formed by the octahedral network. The formation of the Bi-rich defects is believed to affect the physical properties of the thin films.

KW - Keywords Piezoelectric film Planar defect

KW - Microstructure

KW - Scanning transmission electron microscopy

UR - https://www.scopus.com/pages/publications/84924389982

U2 - 10.1016/j.jallcom.2015.02.158

DO - 10.1016/j.jallcom.2015.02.158

M3 - 快报

AN - SCOPUS:84924389982

SN - 0925-8388

VL - 636

SP - 183

EP - 186

JO - Journal of Alloys and Compounds

JF - Journal of Alloys and Compounds

ER -

Atomic structures of planar defects in 0.95(Na_0.5Bi_0.5)TiO₃-0.05BaTiO₃ lead-free piezoelectric thin films

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