Abstract
The occurrence of antiferromagnetic coupling at antiphase domain boundaries (APBs) of ferromagnetic materials holds potential applications for room-temperature spintronic devices. Here, we report formation mechanism and atomic-scale structure properties of APBs in α-Li0.5Fe2.5O4 thin films on MgAl2O4 (001) substrates investigated by means of aberration-corrected scanning transmission electron microscopy. The APBs in the α-Li0.5Fe2.5O4 films are either conservative or non-conservative. Across the APBs the oxygen sublattice in α-Li0.5Fe2.5O4 is maintained, while the stacking sequence of the cation sublattice is interrupted. The propagation of APBs is found to occur in a complex way within the ferromagnetic films, including the dissociation of APBs and the formation of kinks. Importantly, the density of APBs can be tuned by controlling the thickness of the α-Li0.5Fe2.5O4 films since the APBs bound interfacial dislocations contributing to film-substrate strain relaxation. Our results evidence that the nano-scale APBs in the α-Li0.5Fe2.5O4 films are controllable and stable, which could be promising candidates for applications in nano-spintronic devices.
| Original language | English |
|---|---|
| Pages (from-to) | 178-184 |
| Number of pages | 7 |
| Journal | Acta Materialia |
| Volume | 127 |
| DOIs | |
| State | Published - 1 Apr 2017 |
Keywords
- Antiphase boundary
- Ferromagnetic oxide film
- Scanning transmission electron microscopy
- Structure characterization
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