Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr)                         2                         CoO                         4                          films on SrTiO                         3                          (0 0 1) substrates

Hong Mei Jing; Sheng Cheng; Lu Lu; Ming Liu; Kun Liu; Shao Dong Cheng; Shao Bo Mi

doi:10.1016/j.jcrysgro.2019.01.022

Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr) ₂ CoO ₄ films on SrTiO ₃ (0 0 1) substrates

Hong Mei Jing
, Sheng Cheng
, Lu Lu
, Ming Liu
, Kun Liu
, Shao Dong Cheng
, Shao Bo Mi

Faculty of Electronic and Information Engineering

Xi'an Jiaotong University

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

Epitaxial c-axis-oriented (Pr, Sr) ₂ CoO ₄ thin films have been successfully prepared on single-crystalline SrTiO ₃ (0 0 1) substrates by pulsed laser deposition technique. By using advanced imaging techniques and energy-dispersive X-ray spectroscopy mapping, the atomic-scale structural properties of interface and planar faults have been investigated in the (Pr, Sr) ₂ CoO ₄ /SrTiO ₃ (0 0 1) system. Two types of interface structure have been characterized in the heterostructure. The coalescence of different types of interface results in the formation of interfacial dislocations and nano-scale twin lamellae in the films, which in accompany with misfit dislocation contribute to strain relaxation in the heterostructure. In addition, the perovskite (Pr, Sr)CoO ₃ slabs in the films lead to the formation of complex planar faults, which disturb the square-lattice CoO ₂ sheets of the (Pr, Sr) ₂ CoO ₄ films. The findings obtained in the (Pr, Sr) ₂ CoO ₄ /SrTiO ₃ (0 0 1) system could be applicable to other Ruddlesden-Popper phases in the form of thin films.

Original language	English
Pages (from-to)	93-98
Number of pages	6
Journal	Journal of Crystal Growth
Volume	511
DOIs	https://doi.org/10.1016/j.jcrysgro.2019.01.022
State	Published - 1 Apr 2019

Keywords

A1. Defects
A1. Interfaces
A3. Laser epitaxy
B1. Oxides

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10.1016/j.jcrysgro.2019.01.022

Cite this

Jing, H. M., Cheng, S., Lu, L., Liu, M., Liu, K., Cheng, S. D., & Mi, S. B. (2019). Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr) ₂ CoO ₄ films on SrTiO ₃ (0 0 1) substrates Journal of Crystal Growth, 511, 93-98. https://doi.org/10.1016/j.jcrysgro.2019.01.022

Jing, Hong Mei ; Cheng, Sheng ; Lu, Lu et al. / Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr) ₂ CoO ₄ films on SrTiO ₃ (0 0 1) substrates In: Journal of Crystal Growth. 2019 ; Vol. 511. pp. 93-98.

@article{a29fa481480d4543aef59f092073efb9,

title = " Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr) 2 CoO 4 films on SrTiO 3 (0 0 1) substrates ",

abstract = " Epitaxial c-axis-oriented (Pr, Sr) 2 CoO 4 thin films have been successfully prepared on single-crystalline SrTiO 3 (0 0 1) substrates by pulsed laser deposition technique. By using advanced imaging techniques and energy-dispersive X-ray spectroscopy mapping, the atomic-scale structural properties of interface and planar faults have been investigated in the (Pr, Sr) 2 CoO 4 /SrTiO 3 (0 0 1) system. Two types of interface structure have been characterized in the heterostructure. The coalescence of different types of interface results in the formation of interfacial dislocations and nano-scale twin lamellae in the films, which in accompany with misfit dislocation contribute to strain relaxation in the heterostructure. In addition, the perovskite (Pr, Sr)CoO 3 slabs in the films lead to the formation of complex planar faults, which disturb the square-lattice CoO 2 sheets of the (Pr, Sr) 2 CoO 4 films. The findings obtained in the (Pr, Sr) 2 CoO 4 /SrTiO 3 (0 0 1) system could be applicable to other Ruddlesden-Popper phases in the form of thin films.",

keywords = "A1. Defects, A1. Interfaces, A3. Laser epitaxy, B1. Oxides",

author = "Jing, \{Hong Mei\} and Sheng Cheng and Lu Lu and Ming Liu and Kun Liu and Cheng, \{Shao Dong\} and Mi, \{Shao Bo\}",

note = "Publisher Copyright: {\textcopyright} 2019 Elsevier B.V.",

year = "2019",

month = apr,

day = "1",

doi = "10.1016/j.jcrysgro.2019.01.022",

language = "英语",

volume = "511",

pages = "93--98",

journal = "Journal of Crystal Growth",

issn = "0022-0248",

publisher = "Elsevier B.V.",

}

Jing, HM, Cheng, S, Lu, L, Liu, M, Liu, K, Cheng, SD & Mi, SB 2019, ' Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr) ₂ CoO ₄ films on SrTiO ₃ (0 0 1) substrates ', Journal of Crystal Growth, vol. 511, pp. 93-98. https://doi.org/10.1016/j.jcrysgro.2019.01.022

Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr) ₂ CoO ₄ films on SrTiO ₃ (0 0 1) substrates . / Jing, Hong Mei; Cheng, Sheng; Lu, Lu et al.
In: Journal of Crystal Growth, Vol. 511, 01.04.2019, p. 93-98.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr) 2 CoO 4 films on SrTiO 3 (0 0 1) substrates

AU - Jing, Hong Mei

AU - Cheng, Sheng

AU - Lu, Lu

AU - Liu, Ming

AU - Liu, Kun

AU - Cheng, Shao Dong

AU - Mi, Shao Bo

PY - 2019/4/1

Y1 - 2019/4/1

N2 - Epitaxial c-axis-oriented (Pr, Sr) 2 CoO 4 thin films have been successfully prepared on single-crystalline SrTiO 3 (0 0 1) substrates by pulsed laser deposition technique. By using advanced imaging techniques and energy-dispersive X-ray spectroscopy mapping, the atomic-scale structural properties of interface and planar faults have been investigated in the (Pr, Sr) 2 CoO 4 /SrTiO 3 (0 0 1) system. Two types of interface structure have been characterized in the heterostructure. The coalescence of different types of interface results in the formation of interfacial dislocations and nano-scale twin lamellae in the films, which in accompany with misfit dislocation contribute to strain relaxation in the heterostructure. In addition, the perovskite (Pr, Sr)CoO 3 slabs in the films lead to the formation of complex planar faults, which disturb the square-lattice CoO 2 sheets of the (Pr, Sr) 2 CoO 4 films. The findings obtained in the (Pr, Sr) 2 CoO 4 /SrTiO 3 (0 0 1) system could be applicable to other Ruddlesden-Popper phases in the form of thin films.

AB - Epitaxial c-axis-oriented (Pr, Sr) 2 CoO 4 thin films have been successfully prepared on single-crystalline SrTiO 3 (0 0 1) substrates by pulsed laser deposition technique. By using advanced imaging techniques and energy-dispersive X-ray spectroscopy mapping, the atomic-scale structural properties of interface and planar faults have been investigated in the (Pr, Sr) 2 CoO 4 /SrTiO 3 (0 0 1) system. Two types of interface structure have been characterized in the heterostructure. The coalescence of different types of interface results in the formation of interfacial dislocations and nano-scale twin lamellae in the films, which in accompany with misfit dislocation contribute to strain relaxation in the heterostructure. In addition, the perovskite (Pr, Sr)CoO 3 slabs in the films lead to the formation of complex planar faults, which disturb the square-lattice CoO 2 sheets of the (Pr, Sr) 2 CoO 4 films. The findings obtained in the (Pr, Sr) 2 CoO 4 /SrTiO 3 (0 0 1) system could be applicable to other Ruddlesden-Popper phases in the form of thin films.

KW - A1. Defects

KW - A1. Interfaces

KW - A3. Laser epitaxy

KW - B1. Oxides

UR - https://www.scopus.com/pages/publications/85060958404

U2 - 10.1016/j.jcrysgro.2019.01.022

DO - 10.1016/j.jcrysgro.2019.01.022

M3 - 文章

AN - SCOPUS:85060958404

SN - 0022-0248

VL - 511

SP - 93

EP - 98

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

ER -

Jing HM, Cheng S, Lu L, Liu M, Liu K, Cheng SD et al. Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr) ₂ CoO ₄ films on SrTiO ₃ (0 0 1) substrates Journal of Crystal Growth. 2019 Apr 1;511:93-98. doi: 10.1016/j.jcrysgro.2019.01.022

Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr) ₂ CoO ₄ films on SrTiO ₃ (0 0 1) substrates

Abstract

Keywords

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Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr) 2 CoO 4 films on SrTiO 3 (0 0 1) substrates

Abstract

Keywords

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Fingerprint

Cite this

Atomic-scale imaging of heterointerface and planar faults in epitaxial (Pr, Sr) ₂ CoO ₄ films on SrTiO ₃ (0 0 1) substrates