| Original language | English |
|---|---|
| Pages (from-to) | 2089-2090 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 21 |
| Issue number | S3 |
| DOIs | |
| State | Published - 2015 |
Atomic resolution studies of the (K, Na)NbO3/SrTiO3 interface using aberration corrected STEM
- Chao Li
- , Guang Yang
- , Lingyan Wang
- , Zhao Wang
Research output: Contribution to journal › Short survey › peer-review