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Atomic-Resolution Measurement of Oxygen Concentration in Oxide Materials

  • Jülich Research Centre

Research output: Contribution to journalArticlepeer-review

280 Scopus citations

Abstract

Using high-resolution imaging at negative spherical aberration of the objective lens in an aberration-corrected transmission electron microscope, we measure the concentration of oxygen in ∑3{111} twin boundaries in BaTiO 3 thin films at atomic resolution. On average, 68% of the boundary oxygen sites are occupied, and the others are left vacant. The modified Ti 2O9 group unit thus formed reduces the grain boundary energy and provides a way of accommodating oxygen vacancies occurring in oxygen-deficient material by the formation of a nanotwin lamellae structure. The atomically resolved measurement technique offers the potential for studies on oxide materials in which the electronic properties sensitively depend on the local oxygen content.

Original languageEnglish
Pages (from-to)2001-2004
Number of pages4
JournalScience
Volume303
Issue number5666
DOIs
StatePublished - 26 Mar 2004
Externally publishedYes

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