Artifacts induced in metallic glasses during TEM sample preparation

B. B. Sun; Y. B. Wang; J. Wen; H. Yang; M. L. Sui; J. Q. Wang; E. Ma

doi:10.1016/j.scriptamat.2005.06.007

Artifacts induced in metallic glasses during TEM sample preparation

B. B. Sun
, Y. B. Wang
, J. Wen
, H. Yang
, M. L. Sui
, J. Q. Wang
, E. Ma

Research output: Contribution to journal › Article › peer-review

55 Scopus citations

Abstract

The objective of this study is to demonstrate the various artificial features introduced into metallic amorphous alloys by improper TEM sample preparation. Such artifacts are often confused with the intrinsic microstructures when examining metallic glasses under TEM. The electropolishing and ion milling procedures are compared in terms of their merits/drawbacks for avoiding/inducing artifacts in metallic glass samples.

Original language	English
Pages (from-to)	805-809
Number of pages	5
Journal	Scripta Materialia
Volume	53
Issue number	7
DOIs	https://doi.org/10.1016/j.scriptamat.2005.06.007
State	Published - Oct 2005
Externally published	Yes

Keywords

HAADF
HRTEM
Metallic glass
TEM sample preparation

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10.1016/j.scriptamat.2005.06.007

Cite this

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title = "Artifacts induced in metallic glasses during TEM sample preparation",

abstract = "The objective of this study is to demonstrate the various artificial features introduced into metallic amorphous alloys by improper TEM sample preparation. Such artifacts are often confused with the intrinsic microstructures when examining metallic glasses under TEM. The electropolishing and ion milling procedures are compared in terms of their merits/drawbacks for avoiding/inducing artifacts in metallic glass samples.",

keywords = "HAADF, HRTEM, Metallic glass, TEM sample preparation",

author = "Sun, \{B. B.\} and Wang, \{Y. B.\} and J. Wen and H. Yang and Sui, \{M. L.\} and Wang, \{J. Q.\} and E. Ma",

year = "2005",

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AU - Sun, B. B.

AU - Wang, Y. B.

AU - Wen, J.

AU - Yang, H.

AU - Sui, M. L.

AU - Wang, J. Q.

AU - Ma, E.

PY - 2005/10

Y1 - 2005/10

N2 - The objective of this study is to demonstrate the various artificial features introduced into metallic amorphous alloys by improper TEM sample preparation. Such artifacts are often confused with the intrinsic microstructures when examining metallic glasses under TEM. The electropolishing and ion milling procedures are compared in terms of their merits/drawbacks for avoiding/inducing artifacts in metallic glass samples.

AB - The objective of this study is to demonstrate the various artificial features introduced into metallic amorphous alloys by improper TEM sample preparation. Such artifacts are often confused with the intrinsic microstructures when examining metallic glasses under TEM. The electropolishing and ion milling procedures are compared in terms of their merits/drawbacks for avoiding/inducing artifacts in metallic glass samples.

KW - HAADF

KW - HRTEM

KW - Metallic glass

KW - TEM sample preparation

UR - https://www.scopus.com/pages/publications/22644431660

U2 - 10.1016/j.scriptamat.2005.06.007

DO - 10.1016/j.scriptamat.2005.06.007

M3 - 文章

AN - SCOPUS:22644431660

SN - 1359-6462

VL - 53

SP - 805

EP - 809

JO - Scripta Materialia

JF - Scripta Materialia

IS - 7

ER -

Artifacts induced in metallic glasses during TEM sample preparation

Abstract

Keywords

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