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Applying software-based memory error correction for in-memory key-value store: Case studies on memcached and RAMCloud

  • Yin Li
  • , Hao Wang
  • , Xiaoqing Zhao
  • , Hongbin Sun
  • , Tong Zhang
  • Rensselaer Polytechnic Institute
  • Xi'an Jiaotong University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

With the nature of being memory hungry, in-memory key-value store is fundamentally subject to very high memory cost and energy consumption. Intuitively, the availability of a strong memory error correction at sufficiently small redundancy overhead could be leveraged to reduce memory cost and/or energy consumption. Nevertheless, current computing systems handle memory error correction solely in the hardware stack with very weak error correction strength. This paper for the first time studies the practical feasibility of implementing strong memory error correction code (ECC) in the software stack for in-memory key-value store without incurring significant speed performance penalty. This is fundamentally enabled by the low memory bandwidth utilization and relatively simple data structure of in-memory key-value store, which are actually shared with many other datacenter applications (e.g., Web search). This paper presents several design techniques to optimize software-based ECC implementation for in-memory key-value store, and elaborates on several important design issues. Using Memcached and RAMCloud as test vehicles, this work shows that the proposed design solution can improve the memory error correction strength by several orders of magnitude at similar (and even less) coding redundancy compared with current hardware-based design practice, and meanwhile incur less than 6% degradation of in-memory key-value store operational throughput.

Original languageEnglish
Title of host publicationMEMSYS 2016 - Proceedings of the International Symposium on Memory Systems
PublisherAssociation for Computing Machinery
Pages268-278
Number of pages11
ISBN (Electronic)9781450343053
DOIs
StatePublished - 3 Oct 2016
Event2nd International Symposium on Memory Systems, MEMSYS 2016 - Washington, United States
Duration: 3 Oct 20166 Oct 2016

Publication series

NameACM International Conference Proceeding Series
Volume03-06-October-2016

Conference

Conference2nd International Symposium on Memory Systems, MEMSYS 2016
Country/TerritoryUnited States
CityWashington
Period3/10/166/10/16

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 7 - Affordable and Clean Energy
    SDG 7 Affordable and Clean Energy

Keywords

  • Error correction
  • In-memory key-value Store
  • Memory fault tolerance

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