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Application of Silicon Piezoresistive Effect in Mems Embedded Microlfuidic Cooling

  • Yuxin Ye
  • , Shichang Yun
  • , Ruiwen Liu
  • , Wei Li
  • , Zhiqiang Wang
  • , Xiangbin Du
  • , Yanmei Kong
  • , Kunpeng Jia
  • , Nan Zhang
  • , Lihang Yu
  • , Bo Cong
  • , Shiqi Jia
  • , Binbin Jiao
  • , Dapeng Chen
  • CAS - Institute of Microelectronics
  • University of Chinese Academy of Sciences
  • CETC Information Science Academy
  • Zhengzhou University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The multi-sensor fusion test vehicle is proposed to evaluate the mechanical properties in embedded microfluidic cooling. According to the principle of silicon piezoresistive effect, thermal/stress test chip (TSTC) and TSV pressure sensors are fabricated. It is successfully demonstrated the implanted pressure sensors improves the accuracy of pressure data. In addition, the thermal stress caused by local hotspot and the mechanical stress caused by coolant impact together lead to uneven stress distribution on the chip surface. The application of silicon piezoresistive units in embedded microfluidic structure can be used as an important methods for cooling performance and reliability analysis evaluation.

Original languageEnglish
Title of host publication35th IEEE International Conference on Micro Electro Mechanical Systems Conference, MEMS 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages664-667
Number of pages4
ISBN (Electronic)9781665409117
DOIs
StatePublished - 2022
Externally publishedYes
Event35th IEEE International Conference on Micro Electro Mechanical Systems Conference, MEMS 2022 - Tokyo, Japan
Duration: 9 Jan 202213 Jan 2022

Publication series

NameProceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
Volume2022-January
ISSN (Print)1084-6999

Conference

Conference35th IEEE International Conference on Micro Electro Mechanical Systems Conference, MEMS 2022
Country/TerritoryJapan
CityTokyo
Period9/01/2213/01/22

Keywords

  • Silicon piezoresistive effect
  • TSV pressure sensor
  • embedded cooling
  • thermal/stress test chip

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