APPLICATION OF RELATIVISTIC ELECTRONS FOR THE QUANTITATIVE ANALYSIS OF TRACE ELEMENTS.

D. H.H. Hoffmann; C. Brendel; H. Genz; W. Loew; A. Richter

APPLICATION OF RELATIVISTIC ELECTRONS FOR THE QUANTITATIVE ANALYSIS OF TRACE ELEMENTS.

D. H.H. Hoffmann
, C. Brendel
, H. Genz
, W. Loew
, A. Richter

School of Physics

Research output: Contribution to journal › Conference article › peer-review

Abstract

Particle induced X-ray emission methods (PIXE) have been extended to relativistic electrons to induce X-ray emission (REIXE) for quantitative trace-element analysis. Systematic measurements of absolute K-, L- and M-shell ionization cross sections revealed a scaling behavior of inner-shell ionization cross sections from which X-ray production cross sections can be deduced for any element of interest for a quantitative sample investigation. Using a multielemental mineral monazite sample from Malaysia, the sensitivity of REIXE is compared to well established methods of trace-element analysis like proton- and X-ray-induced X-ray fluorescence analysis.

Original language	English
Pages (from-to)	279-282
Number of pages	4
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	231 (B3)
Issue number	1-3
State	Published - 1983
Event	Part Induced X-Ray Emiss and its Anal Appl 3, Proc of the Int Conf, 3rd - Heidelberg, W Ger Duration: 18 Jul 1983 → 22 Jul 1983

Cite this

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title = "APPLICATION OF RELATIVISTIC ELECTRONS FOR THE QUANTITATIVE ANALYSIS OF TRACE ELEMENTS.",

abstract = "Particle induced X-ray emission methods (PIXE) have been extended to relativistic electrons to induce X-ray emission (REIXE) for quantitative trace-element analysis. Systematic measurements of absolute K-, L- and M-shell ionization cross sections revealed a scaling behavior of inner-shell ionization cross sections from which X-ray production cross sections can be deduced for any element of interest for a quantitative sample investigation. Using a multielemental mineral monazite sample from Malaysia, the sensitivity of REIXE is compared to well established methods of trace-element analysis like proton- and X-ray-induced X-ray fluorescence analysis.",

author = "Hoffmann, \{D. H.H.\} and C. Brendel and H. Genz and W. Loew and A. Richter",

year = "1983",

language = "英语",

volume = "231 (B3)",

pages = "279--282",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier B.V.",

number = "1-3",

note = "Part Induced X-Ray Emiss and its Anal Appl 3, Proc of the Int Conf, 3rd ; Conference date: 18-07-1983 Through 22-07-1983",

}

TY - JOUR

T1 - APPLICATION OF RELATIVISTIC ELECTRONS FOR THE QUANTITATIVE ANALYSIS OF TRACE ELEMENTS.

AU - Hoffmann, D. H.H.

AU - Brendel, C.

AU - Genz, H.

AU - Loew, W.

AU - Richter, A.

PY - 1983

Y1 - 1983

N2 - Particle induced X-ray emission methods (PIXE) have been extended to relativistic electrons to induce X-ray emission (REIXE) for quantitative trace-element analysis. Systematic measurements of absolute K-, L- and M-shell ionization cross sections revealed a scaling behavior of inner-shell ionization cross sections from which X-ray production cross sections can be deduced for any element of interest for a quantitative sample investigation. Using a multielemental mineral monazite sample from Malaysia, the sensitivity of REIXE is compared to well established methods of trace-element analysis like proton- and X-ray-induced X-ray fluorescence analysis.

AB - Particle induced X-ray emission methods (PIXE) have been extended to relativistic electrons to induce X-ray emission (REIXE) for quantitative trace-element analysis. Systematic measurements of absolute K-, L- and M-shell ionization cross sections revealed a scaling behavior of inner-shell ionization cross sections from which X-ray production cross sections can be deduced for any element of interest for a quantitative sample investigation. Using a multielemental mineral monazite sample from Malaysia, the sensitivity of REIXE is compared to well established methods of trace-element analysis like proton- and X-ray-induced X-ray fluorescence analysis.

UR - https://www.scopus.com/pages/publications/0020738546

M3 - 会议文章

AN - SCOPUS:0020738546

SN - 0168-583X

VL - 231 (B3)

SP - 279

EP - 282

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

IS - 1-3

T2 - Part Induced X-Ray Emiss and its Anal Appl 3, Proc of the Int Conf, 3rd

Y2 - 18 July 1983 through 22 July 1983

ER -

APPLICATION OF RELATIVISTIC ELECTRONS FOR THE QUANTITATIVE ANALYSIS OF TRACE ELEMENTS.

Abstract

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