Application of BEM to high-voltage junction termination

Zilu Wu; Yumin Gao; Jinsheng Luo; Xun Hou; Guofu Chen

doi:10.1109/43.952738

Application of BEM to high-voltage junction termination

Zilu Wu
, Yumin Gao
, Jinsheng Luo
, Xun Hou
, Guofu Chen

CAS - Xi'an Institute of Optics and Precision Mechanics
Xi'an Jiaotong University

Research output: Contribution to journal › Article › peer-review

Abstract

Ideas for using the boundary element method (BEM) with the concept of critical electric field for simulation of high-voltage junction termination are introduced. Approaches for dealing with interface charges, depleted regions, and metal field plates are presented. Rules used to develop and apply the BEM program are given. Simulation of one silicon-on-insulator diode is performed and the results are compared with those obtained using the finite difference method.

Original language	English
Pages (from-to)	1218-1225
Number of pages	8
Journal	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume	20
Issue number	10
DOIs	https://doi.org/10.1109/43.952738
State	Published - Oct 2001
Externally published	Yes

Keywords

Boundary element method
Critical electric field
Junction termination
SOI
Simulation

Access to Document

10.1109/43.952738

Cite this

@article{dde68a2c5496468a9c202976d811a6dc,

title = "Application of BEM to high-voltage junction termination",

abstract = "Ideas for using the boundary element method (BEM) with the concept of critical electric field for simulation of high-voltage junction termination are introduced. Approaches for dealing with interface charges, depleted regions, and metal field plates are presented. Rules used to develop and apply the BEM program are given. Simulation of one silicon-on-insulator diode is performed and the results are compared with those obtained using the finite difference method.",

keywords = "Boundary element method, Critical electric field, Junction termination, SOI, Simulation",

author = "Zilu Wu and Yumin Gao and Jinsheng Luo and Xun Hou and Guofu Chen",

year = "2001",

month = oct,

doi = "10.1109/43.952738",

language = "英语",

volume = "20",

pages = "1218--1225",

journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",

issn = "0278-0070",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "10",

}

TY - JOUR

T1 - Application of BEM to high-voltage junction termination

AU - Wu, Zilu

AU - Gao, Yumin

AU - Luo, Jinsheng

AU - Hou, Xun

AU - Chen, Guofu

PY - 2001/10

Y1 - 2001/10

N2 - Ideas for using the boundary element method (BEM) with the concept of critical electric field for simulation of high-voltage junction termination are introduced. Approaches for dealing with interface charges, depleted regions, and metal field plates are presented. Rules used to develop and apply the BEM program are given. Simulation of one silicon-on-insulator diode is performed and the results are compared with those obtained using the finite difference method.

AB - Ideas for using the boundary element method (BEM) with the concept of critical electric field for simulation of high-voltage junction termination are introduced. Approaches for dealing with interface charges, depleted regions, and metal field plates are presented. Rules used to develop and apply the BEM program are given. Simulation of one silicon-on-insulator diode is performed and the results are compared with those obtained using the finite difference method.

KW - Boundary element method

KW - Critical electric field

KW - Junction termination

KW - SOI

KW - Simulation

UR - https://www.scopus.com/pages/publications/0035473395

U2 - 10.1109/43.952738

DO - 10.1109/43.952738

M3 - 文章

AN - SCOPUS:0035473395

SN - 0278-0070

VL - 20

SP - 1218

EP - 1225

JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

IS - 10

ER -

Application of BEM to high-voltage junction termination

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this