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Anatomy of vertical heteroepitaxial interfaces reveals the memristive mechanism in Nb2O5-NaNbO3 thin films

  • Linglong Li
  • , Lu Lu
  • , Zhiguang Wang
  • , Yanxi Li
  • , Yonggang Yao
  • , Dawei Zhang
  • , Guang Yang
  • , Jianjun Yao
  • , Dwight Viehland
  • , Yaodong Yang
  • Xi'an Jiaotong University
  • Virginia Polytechnic Institute and State University
  • Oxford Instruments Group Plc

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

Dynamic oxygen vacancies play a significant role in memristive switching materials and memristors can be realized via well controlled doping. Based on this idea we deposite Nb2O5-NaNbO3 nanocomposite thin films on SrRuO3-buffered LaAlO3 substrates. Through the spontaneous phase separation and self-assembly growth, two phases form clear vertical heteroepitaxial nanostructures. The interfaces between niobium oxide and sodium niobate full of ion vacancies form the conductive channels. Alternative I-V behavior attributed to dynamic ion migration reveals the memristive switching mechanism under the external bias. We believe that this phenomenon has a great potential in future device applications.

Original languageEnglish
Article number9229
JournalScientific Reports
Volume5
DOIs
StatePublished - 17 Mar 2015

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