Skip to main navigation Skip to search Skip to main content

Analytical loss model of low voltage enhancement mode GaN HEMTs

  • Xi'an Jiaotong University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

An analytical model is proposed in this paper to calculate the switching loss of low voltage enhancement mode Gallium Nitride high electron mobility transistors (eGaN HEMTs). The switching process is illustrated in detail. The switching loss is obtained by solving the equivalent circuits during the switching transition. A good agreement is shown between the analytical model and Spice simulation results. In addition, in order to accurately measure the current transition waveform, a novel current measuring method based on magnetic coupling is proposed. Finally, a buck converter is designed to validate the accuracy of the proposed model.

Original languageEnglish
Title of host publication2014 IEEE Energy Conversion Congress and Exposition, ECCE 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages100-105
Number of pages6
ISBN (Electronic)9781479956982
DOIs
StatePublished - 11 Nov 2014

Publication series

Name2014 IEEE Energy Conversion Congress and Exposition, ECCE 2014

Fingerprint

Dive into the research topics of 'Analytical loss model of low voltage enhancement mode GaN HEMTs'. Together they form a unique fingerprint.

Cite this