@inproceedings{82abbf9dd71344f1b9520a24968ba2ed,
title = "Analysis of Dielectric Properties and Space Charge Characteristics of the Heat-Conducting Silicone Gel for Encapsulation",
abstract = "With the rapid advancement of high-integration power modules, the encapsulation structure is faced with a severe challenge of increasing electrical and thermal stress. Subjected to direct current (DC) conductions, space charge accumulation and charge transportation can cause local electric field distortion, exacerbate insulation aging, and thereby increase the risk of breakdown failure. In this paper, A heat-conducting silicone gel is taken as the research object. The space charge measurement under high-temperature DC voltages is conducted based on pulsed electro-acoustic (PEA) method. The DC conductivity and DC breakdown strength are also tested at corresponding temperatures. It is found the breakdown performance of silicone gel degrades with temperature, while the DC conductivity increases slightly. The electrode charge injection is analyzed as the main source of homocharge accumulation. Under thermal excitation, the ability of molecular chains to release electrons increases with the temperature increasing, which is reflected as an increasement of hole injection within a certain period after polarization.",
keywords = "Breakdown strength, DC conductivity, Dielectric property, Silicone gel, Space charge",
author = "Xinyue Zhang and Zepeng Lv and Qixuan Wang and Chen Zhang and Kai Wu and Yonghong Cheng",
note = "Publisher Copyright: {\textcopyright} Beijing Paike Culture Commu. Co., Ltd. 2025.; 19th Annual Conference of China Electrotechnical Society, ACCES 2024 ; Conference date: 20-09-2024 Through 22-09-2024",
year = "2025",
doi = "10.1007/978-981-96-4675-3\_43",
language = "英语",
isbn = "9789819646746",
series = "Lecture Notes in Electrical Engineering",
publisher = "Springer Science and Business Media Deutschland GmbH",
pages = "407--415",
editor = "Qingxin Yang and Zhaohong Bie and Xu Yang",
booktitle = "The Proceedings of the 19th Annual Conference of China Electrotechnical Society - Volume VII",
}