Analysis and Simulation of the Influence of 'V' Beam on the Impact Resistance of Micro Quartz Tuning Gyroscopes

Bing Bai; Yulong Zhao; Cun Li; Chao Han

doi:10.1109/SENSORS43011.2019.8956788

Analysis and Simulation of the Influence of 'V' Beam on the Impact Resistance of Micro Quartz Tuning Gyroscopes

Bing Bai
, Yulong Zhao
, Cun Li
, Chao Han

School of Mechanical Engineering

Xi'an Jiaotong University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

For the effect of the anchor point and the vibration structure connecting beam - V beam in the micro quartz tuning fork gyroscope, based on the normalized shock response spectrum in the International Organization for Standardization, the finite element analysis simulation software was used to analyze the stress of different V beam thickness parameters when subjected to 1500g and 2 ms half sine impact in six directions. The simulation results show that when the thickness is 80 μm, the max stress is 94.721 MPa, and when the thickness is 75 μm, the max stress is 100.512 MPa. Due to the breaking strength of the quartz material (95 MPa), the minimum thickness of V beam is about 80 μm. And the gyroscope with V beam thickness of 80 μm is verified by impact test.

Original language	English
Title of host publication	2019 IEEE Sensors, SENSORS 2019 - Conference Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781728116341
DOIs	https://doi.org/10.1109/SENSORS43011.2019.8956788
State	Published - Oct 2019
Event	18th IEEE Sensors, SENSORS 2019 - Montreal, Canada Duration: 27 Oct 2019 → 30 Oct 2019

Publication series

Name	Proceedings of IEEE Sensors
Volume	2019-October
ISSN (Print)	1930-0395
ISSN (Electronic)	2168-9229

Conference

Conference	18th IEEE Sensors, SENSORS 2019
Country/Territory	Canada
City	Montreal
Period	27/10/19 → 30/10/19

Keywords

half sine impact
impact test
modeling and simulation
quartz tuning fork gyroscope
shock response spectrum

Access to Document

10.1109/SENSORS43011.2019.8956788

Cite this

Bai, B., Zhao, Y., Li, C., & Han, C. (2019). Analysis and Simulation of the Influence of 'V' Beam on the Impact Resistance of Micro Quartz Tuning Gyroscopes. In 2019 IEEE Sensors, SENSORS 2019 - Conference Proceedings Article 8956788 (Proceedings of IEEE Sensors; Vol. 2019-October). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SENSORS43011.2019.8956788

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title = "Analysis and Simulation of the Influence of 'V' Beam on the Impact Resistance of Micro Quartz Tuning Gyroscopes",

abstract = "For the effect of the anchor point and the vibration structure connecting beam - V beam in the micro quartz tuning fork gyroscope, based on the normalized shock response spectrum in the International Organization for Standardization, the finite element analysis simulation software was used to analyze the stress of different V beam thickness parameters when subjected to 1500g and 2 ms half sine impact in six directions. The simulation results show that when the thickness is 80 μm, the max stress is 94.721 MPa, and when the thickness is 75 μm, the max stress is 100.512 MPa. Due to the breaking strength of the quartz material (95 MPa), the minimum thickness of V beam is about 80 μm. And the gyroscope with V beam thickness of 80 μm is verified by impact test.",

keywords = "half sine impact, impact test, modeling and simulation, quartz tuning fork gyroscope, shock response spectrum",

author = "Bing Bai and Yulong Zhao and Cun Li and Chao Han",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 18th IEEE Sensors, SENSORS 2019 ; Conference date: 27-10-2019 Through 30-10-2019",

year = "2019",

month = oct,

doi = "10.1109/SENSORS43011.2019.8956788",

language = "英语",

series = "Proceedings of IEEE Sensors",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2019 IEEE Sensors, SENSORS 2019 - Conference Proceedings",

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Bai, B, Zhao, Y, Li, C & Han, C 2019, Analysis and Simulation of the Influence of 'V' Beam on the Impact Resistance of Micro Quartz Tuning Gyroscopes. in 2019 IEEE Sensors, SENSORS 2019 - Conference Proceedings., 8956788, Proceedings of IEEE Sensors, vol. 2019-October, Institute of Electrical and Electronics Engineers Inc., 18th IEEE Sensors, SENSORS 2019, Montreal, Canada, 27/10/19. https://doi.org/10.1109/SENSORS43011.2019.8956788

Analysis and Simulation of the Influence of 'V' Beam on the Impact Resistance of Micro Quartz Tuning Gyroscopes. / Bai, Bing; Zhao, Yulong; Li, Cun et al.
2019 IEEE Sensors, SENSORS 2019 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. 8956788 (Proceedings of IEEE Sensors; Vol. 2019-October).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Analysis and Simulation of the Influence of 'V' Beam on the Impact Resistance of Micro Quartz Tuning Gyroscopes

AU - Bai, Bing

AU - Zhao, Yulong

AU - Li, Cun

AU - Han, Chao

PY - 2019/10

Y1 - 2019/10

N2 - For the effect of the anchor point and the vibration structure connecting beam - V beam in the micro quartz tuning fork gyroscope, based on the normalized shock response spectrum in the International Organization for Standardization, the finite element analysis simulation software was used to analyze the stress of different V beam thickness parameters when subjected to 1500g and 2 ms half sine impact in six directions. The simulation results show that when the thickness is 80 μm, the max stress is 94.721 MPa, and when the thickness is 75 μm, the max stress is 100.512 MPa. Due to the breaking strength of the quartz material (95 MPa), the minimum thickness of V beam is about 80 μm. And the gyroscope with V beam thickness of 80 μm is verified by impact test.

AB - For the effect of the anchor point and the vibration structure connecting beam - V beam in the micro quartz tuning fork gyroscope, based on the normalized shock response spectrum in the International Organization for Standardization, the finite element analysis simulation software was used to analyze the stress of different V beam thickness parameters when subjected to 1500g and 2 ms half sine impact in six directions. The simulation results show that when the thickness is 80 μm, the max stress is 94.721 MPa, and when the thickness is 75 μm, the max stress is 100.512 MPa. Due to the breaking strength of the quartz material (95 MPa), the minimum thickness of V beam is about 80 μm. And the gyroscope with V beam thickness of 80 μm is verified by impact test.

KW - half sine impact

KW - impact test

KW - modeling and simulation

KW - quartz tuning fork gyroscope

KW - shock response spectrum

UR - https://www.scopus.com/pages/publications/85078697554

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DO - 10.1109/SENSORS43011.2019.8956788

M3 - 会议稿件

AN - SCOPUS:85078697554

T3 - Proceedings of IEEE Sensors

BT - 2019 IEEE Sensors, SENSORS 2019 - Conference Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 18th IEEE Sensors, SENSORS 2019

Y2 - 27 October 2019 through 30 October 2019

ER -

Analysis and Simulation of the Influence of 'V' Beam on the Impact Resistance of Micro Quartz Tuning Gyroscopes

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