An investigation of residual stress of porous titania layer by micro-arc oxidation under different voltages

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Abstract

The surface modification of titanium by micro-arc oxidation under different voltages was processed to achieve good direct oseointegration. The new technique of two-dimensional X-ray diffraction was used to measure the residual stress of the layer. The results show that a porous titania layer containing Ca and P is obtained by micro-arc oxidation. The pore size and Ca/P of the layer are affected by the voltage. The high voltage can induce forming CaTiO3. The residual stress under different voltage is compressive stress and increases with the improvement of the voltage.

Original languageEnglish
Title of host publicationResidual Stresses VII, ICRS 7 - Proceedings of the 7th International Conference on Residual Stresses, ICRS-7
PublisherTrans Tech Publications Ltd
Pages552-557
Number of pages6
ISBN (Print)0878499695, 9780878499694
DOIs
StatePublished - 2005
Event7th International Conference on Residual Stresses, ICRS-7 - Xi'an, China
Duration: 14 Jun 200417 Jun 2004

Publication series

NameMaterials Science Forum
Volume490-491
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

Conference7th International Conference on Residual Stresses, ICRS-7
Country/TerritoryChina
CityXi'an
Period14/06/0417/06/04

Keywords

  • Micro-arc oxidation
  • Residual stress two-dimensional
  • Titanium
  • X-ray diffraction

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