An Accurate and Efficient Method for Eliminating the Requirement of Coherent Sampling in Multi-Tone Test

  • Cheng Ban
  • , Minshun Wu
  • , Jiangtao Xu
  • , Li Geng
  • , Degang Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Multi-tone test is critical in evaluating the overall spectral performance of integrated circuits, especially when the whole signal bandwidth is filled with various frequency components. Coherent sampling is a major challenge for achieving accurate test results in multi-tone test, because it is difficult to simultaneously control all the signal tones precisely. Once coherent sampling is not satisfied, the spectral leakages and their overlap effect will deteriorate the spectral test results. In this paper, a new algorithm is proposed to eliminate the requirement of coherent sampling in multi-tone test. In this method, all the tones are simultaneously estimated with a two-step method which employs merely two FFTs and a few simply mathematical operations. Then new coherent data is reconstructed by replacing the noncoherent fundamentals with coherent tones, all the spectral leakages are removed. Extensive simulation results demonstrate that the proposed method can achieve the same testing accuracy as coherent sampling methods in arbitrary level of noncoherency. The proposed method greatly relaxes the test setup for multi-tone test, and hence the test cost can be reduced significantly.

Original languageEnglish
Title of host publication2019 IEEE 37th VLSI Test Symposium, VTS 2019
PublisherIEEE Computer Society
ISBN (Electronic)9781728111704
DOIs
StatePublished - Apr 2019
Event37th IEEE VLSI Test Symposium, VTS 2019 - Monterey, United States
Duration: 23 Apr 201925 Apr 2019

Publication series

NameProceedings of the IEEE VLSI Test Symposium
Volume2019-April

Conference

Conference37th IEEE VLSI Test Symposium, VTS 2019
Country/TerritoryUnited States
CityMonterey
Period23/04/1925/04/19

Keywords

  • Spectral test
  • analog-to-digital converters
  • multi-tone
  • noncoherent sampling
  • spectral overlap

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