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Amplitude Difference Changes-Based Metrological Scheme for Force Detection in a Mode-Localized 5-Beam Array

  • Jilin University
  • Tsinghua University
  • National Institute of Advanced Industrial Science and Technology

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

In this paper, amplitude difference changes (abbreviated as Madc) is proposed as a metrological scheme to characterize a coupled 5-beam array for force detection application for the first time. A new theoretical model, taking account of force perturbation effect on amplitude difference changes, is constructed with the 5-beam array. The proposed Madc-based metrological scheme shows linear characteristics across a wider force range, compared to the conventional amplitude changes based one (abbreviated as Mac) with a monotonically increasing curve. When applying magnetic force perturbation lower than 0.5N, a sensitivity of 23.5% (mm·N-1) is estimated from the proposed Madc-based scheme, 3.36 times of magnitude higher than that of 7% (mm·N-1) from the Mac-based one. The amplitude difference changes as a linear function of the force perturbation is verified in the present coupled 5-beam array, but the proposed metrological scheme is believed to be also applicable to other multi-resonator array based force sensor devices.

Original languageEnglish
Article number8910554
Pages (from-to)2877-2884
Number of pages8
JournalIEEE Sensors Journal
Volume20
Issue number6
DOIs
StatePublished - 15 Mar 2020
Externally publishedYes

Keywords

  • 5-beam array
  • Metrological scheme
  • amplitude difference changes
  • force detection
  • mode localization
  • new theoretical model
  • sensitivity and linearity

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