AFM study of lamellar structure of melt-crystallized n-alkane C 390H782

A. Tracz; G. Ungar

doi:10.1021/ma050494q

AFM study of lamellar structure of melt-crystallized n-alkane C ₃₉₀H₇₈₂

A. Tracz
, G. Ungar

Polish Academy of Sciences
University of Sheffield

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

The morphology of alkane C₃₉₀H₇₈₂ using the substrate detachment technique for studies of melt crystallized PE ^18-20 by atomic force microscopy (AFM) was investigated. The surface of the polymer sample crystallized in contact with an atomically flat substrate was exposed by gentle detachment from the substrate. Rectangular silicon cantilevers model RTESP7 were used in the investigation. It was observed that a range of morphologies, formed during nonisothermal crystallization can be observed at different distances from the substrate.

Original language	English
Pages (from-to)	4962-4965
Number of pages	4
Journal	Macromolecules
Volume	38
Issue number	12
DOIs	https://doi.org/10.1021/ma050494q
State	Published - 14 Jun 2005
Externally published	Yes

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title = "AFM study of lamellar structure of melt-crystallized n-alkane C 390H782",

abstract = "The morphology of alkane C390H782 using the substrate detachment technique for studies of melt crystallized PE 18-20 by atomic force microscopy (AFM) was investigated. The surface of the polymer sample crystallized in contact with an atomically flat substrate was exposed by gentle detachment from the substrate. Rectangular silicon cantilevers model RTESP7 were used in the investigation. It was observed that a range of morphologies, formed during nonisothermal crystallization can be observed at different distances from the substrate.",

author = "A. Tracz and G. Ungar",

year = "2005",

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day = "14",

doi = "10.1021/ma050494q",

language = "英语",

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T1 - AFM study of lamellar structure of melt-crystallized n-alkane C 390H782

AU - Tracz, A.

AU - Ungar, G.

PY - 2005/6/14

Y1 - 2005/6/14

N2 - The morphology of alkane C390H782 using the substrate detachment technique for studies of melt crystallized PE 18-20 by atomic force microscopy (AFM) was investigated. The surface of the polymer sample crystallized in contact with an atomically flat substrate was exposed by gentle detachment from the substrate. Rectangular silicon cantilevers model RTESP7 were used in the investigation. It was observed that a range of morphologies, formed during nonisothermal crystallization can be observed at different distances from the substrate.

AB - The morphology of alkane C390H782 using the substrate detachment technique for studies of melt crystallized PE 18-20 by atomic force microscopy (AFM) was investigated. The surface of the polymer sample crystallized in contact with an atomically flat substrate was exposed by gentle detachment from the substrate. Rectangular silicon cantilevers model RTESP7 were used in the investigation. It was observed that a range of morphologies, formed during nonisothermal crystallization can be observed at different distances from the substrate.

UR - https://www.scopus.com/pages/publications/21644458375

U2 - 10.1021/ma050494q

DO - 10.1021/ma050494q

M3 - 文章

AN - SCOPUS:21644458375

SN - 0024-9297

VL - 38

SP - 4962

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JO - Macromolecules

JF - Macromolecules

IS - 12

ER -

AFM study of lamellar structure of melt-crystallized n-alkane C ₃₉₀H₇₈₂

Abstract

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