TY - JOUR
T1 - Adversarial Multiple-Target Domain Adaptation for Fault Classification
AU - Ragab, Mohamed
AU - Chen, Zhenghua
AU - Wu, Min
AU - Li, Haoliang
AU - Kwoh, Chee Keong
AU - Yan, Ruqiang
AU - Li, Xiaoli
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2021
Y1 - 2021
N2 - Data-driven fault classification methods are receiving great attention as they can be applied to many real-world applications. However, they work under the assumption that training data and testing data are drawn from the same distribution. Practical scenarios have varying operating conditions, which results in a domain-shift problem that significantly deteriorates the diagnosis performance. Recently, domain adaptation (DA) has been explored to address the domain-shift problem by transferring the knowledge from labeled source domain (e.g., source working condition) to unlabeled target domain (e.g., target working condition). Yet, all the existing methods are working under single-source single-target (1S1T) settings. Hence, a new model needs to be trained for each new target domain. This shows limited scalability in handling multiple working conditions since different models should be trained for different target working conditions, which is clearly not a viable solution in practice. To address this problem, we propose a novel adversarial multiple-target DA (AMDA) method for single-source multiple-target (1SmT) scenario, where the model can generalize to multiple-target domains concurrently. Adversarial adaptation is applied to transform the multiple-target domain features to be invariant from the single-source-domain features. This leads to a scalable model with a novel capability of generalizing to multiple-target domains. Extensive experiments on two public datasets and one self-collected dataset have demonstrated that the proposed method outperforms state-of-the-art methods consistently. Our source codes and data are available at https://github.com/mohamedr002/AMDA.
AB - Data-driven fault classification methods are receiving great attention as they can be applied to many real-world applications. However, they work under the assumption that training data and testing data are drawn from the same distribution. Practical scenarios have varying operating conditions, which results in a domain-shift problem that significantly deteriorates the diagnosis performance. Recently, domain adaptation (DA) has been explored to address the domain-shift problem by transferring the knowledge from labeled source domain (e.g., source working condition) to unlabeled target domain (e.g., target working condition). Yet, all the existing methods are working under single-source single-target (1S1T) settings. Hence, a new model needs to be trained for each new target domain. This shows limited scalability in handling multiple working conditions since different models should be trained for different target working conditions, which is clearly not a viable solution in practice. To address this problem, we propose a novel adversarial multiple-target DA (AMDA) method for single-source multiple-target (1SmT) scenario, where the model can generalize to multiple-target domains concurrently. Adversarial adaptation is applied to transform the multiple-target domain features to be invariant from the single-source-domain features. This leads to a scalable model with a novel capability of generalizing to multiple-target domains. Extensive experiments on two public datasets and one self-collected dataset have demonstrated that the proposed method outperforms state-of-the-art methods consistently. Our source codes and data are available at https://github.com/mohamedr002/AMDA.
KW - Adversarial domain adaptation (DA)
KW - convolutional neural network (CNN)
KW - discriminator
KW - intelligent fault diagnosis
KW - single-source multiple-targets (1SmTs)
UR - https://www.scopus.com/pages/publications/85096778330
U2 - 10.1109/TIM.2020.3009341
DO - 10.1109/TIM.2020.3009341
M3 - 文章
AN - SCOPUS:85096778330
SN - 0018-9456
VL - 70
JO - IEEE Transactions on Instrumentation and Measurement
JF - IEEE Transactions on Instrumentation and Measurement
M1 - 9141312
ER -