TY - GEN
T1 - Adaptive beam hardening correction based on projection data consistency condition
AU - Tang, Shaojie
AU - Mou, Xuanqin
AU - Xu, Qiong
AU - Zhang, Yanbo
AU - Yu, Hengyong
PY - 2010
Y1 - 2010
N2 - In the medical diagnostic computed tomography (CT) systems, the x-ray tube usually emits photons with a polychromatic spectrum, resulting in beam hardening artifacts in the reconstructed images. Although the bone correction method is extensively used to compensate for the beam hardening artifacts, its performance crucially depends on the empirical choice of a scaling factor. To overcome this shortcoming, here we propose two adaptive correction methods, which utilize the Helgasson-Ludwig (H-L) consistency condition to determine the optimal scaling factor and the corresponding coefficient vector. Our numerical simulation results demonstrate the effectiveness of the proposed methods.
AB - In the medical diagnostic computed tomography (CT) systems, the x-ray tube usually emits photons with a polychromatic spectrum, resulting in beam hardening artifacts in the reconstructed images. Although the bone correction method is extensively used to compensate for the beam hardening artifacts, its performance crucially depends on the empirical choice of a scaling factor. To overcome this shortcoming, here we propose two adaptive correction methods, which utilize the Helgasson-Ludwig (H-L) consistency condition to determine the optimal scaling factor and the corresponding coefficient vector. Our numerical simulation results demonstrate the effectiveness of the proposed methods.
UR - https://www.scopus.com/pages/publications/79960364095
U2 - 10.1109/NSSMIC.2010.5874199
DO - 10.1109/NSSMIC.2010.5874199
M3 - 会议稿件
AN - SCOPUS:79960364095
SN - 9781424491063
T3 - IEEE Nuclear Science Symposium Conference Record
SP - 2325
EP - 2329
BT - IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
T2 - 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Y2 - 30 October 2010 through 6 November 2010
ER -