@inproceedings{b435e5a14468497083f159c04cb9917c,
title = "Achievement of a high-sensitive and high-overload sensor based on the bossed-diaphragm structure",
abstract = "The paper presents a piezoresistive absolute micro-pressure sensor for altimetry. This investigation includes the design, fabrication and testing of the sensor. An improved structure is studied through incorporating sensitive beams into the bossed-diaphragm structure. By analyzing the stress distribution of sensitive elements using finite element method (FEM), the configuration shows an enhanced sensitivity and a proper overload resistance. Equations about surface stress and deflection of the sensor are established by multivariate fittings based on ANSYS loop calculation results. Structure dimensions are optimized and determined by MATLAB. Silicon bulk micromachining technology is utilized to fabricate the sensor prototype, and the processing is discussed. The outputs under both static and dynamic conditions are tested. Experimental results demonstrate the sensor features a relatively high sensitivity of 11.655 μV/V/Pa in the operating range of 500 Pa at room temperature and a proper overload resistance of 200 times overpressure to promise its survival under atmosphere. The favorable performances enable the sensor's application in measuring absolute micro pressure.",
keywords = "MEMS, Piezoresistive, high-overload, high-sensitive, micro-pressure",
author = "Zhongliang Yu and Yulong Zhao and Lili Li and Cun Li and Guanwu Zhou and Bian Tian",
note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE-NEMS 2014 ; Conference date: 13-04-2014 Through 16-04-2014",
year = "2014",
month = sep,
day = "23",
doi = "10.1109/NEMS.2014.6908787",
language = "英语",
series = "9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE-NEMS 2014",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "186--190",
booktitle = "9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE-NEMS 2014",
}