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Absorptive reduction and width narrowing in λ-type atoms confined between two dielectric walls

  • Yuan Yuan Li
  • , Xun Hou
  • , Jin Tao Bai
  • , Jun Feng Yan
  • , Chen Li Gan
  • , Yan Peng Zhang
  • Northwest University China
  • CAS - Xi'an Institute of Optics and Precision Mechanics
  • Xi'an Jiaotong University

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

This paper investigates the absorptive reduction and the width narrowing of electromagnetically induced transparency (EIT) in a thin vapour film of λ-type atoms confined between two dielectric walls whose thickness is comparable with the wavelength of the probe field. The absorptive lines of the weak probe field exhibit strong reductions and very narrow EIT dips, which mainly results from the velocity slow-down effects and transient behaviour of atoms in a confined system. It is also shown that the lines are modified by the strength of the coupling field and the ratio of L/λ, with L the film thickness and λ the wavelength of the probe field. A simple robust recipe for EIT in a thin medium is achievable in experiment.

Original languageEnglish
Pages (from-to)2885-2889
Number of pages5
JournalChinese Physics B
Volume17
Issue number8
DOIs
StatePublished - 1 Aug 2008
Externally publishedYes

Keywords

  • Absorptive reduction
  • Electromagnetically induced transparency
  • Width narrowing

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