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Ab initio modeling of Schottky-barrier height tuning by yttrium at nickel silicide/silicon interface

  • Li Geng
  • , Blanka Magyari-Kope
  • , Zhiyong Zhang
  • , Yoshio Nishi
  • Stanford University

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

The mechanism of Schottky-barrier height (SBH) tuning by yttrium (Y) segregated at nickel silicide (NiSi2)/silicon interface is investigated based on first-principle calculations. SBH modification can be explained by a new chemical structure that forms when Y atoms substitute silicon atoms near the interface. Silicon dangling bonds are saturated, leading to a new pinning-free interfacial structure. When other layers of Y atoms are segregated in NiSi2, SBH for electrons can be reduced from 0.65 to 0.1 eV. The previously reported experimental phenomena can be explained by the calculations.

Original languageEnglish
Pages (from-to)746-749
Number of pages4
JournalIEEE Electron Device Letters
Volume29
Issue number7
DOIs
StatePublished - Jul 2008

Keywords

  • Nickel silicide (NiSi))
  • Schottky barrier (SB) modulation
  • Segregation
  • Yttrium (Y)

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