Abstract
The mechanism of Schottky-barrier height (SBH) tuning by yttrium (Y) segregated at nickel silicide (NiSi2)/silicon interface is investigated based on first-principle calculations. SBH modification can be explained by a new chemical structure that forms when Y atoms substitute silicon atoms near the interface. Silicon dangling bonds are saturated, leading to a new pinning-free interfacial structure. When other layers of Y atoms are segregated in NiSi2, SBH for electrons can be reduced from 0.65 to 0.1 eV. The previously reported experimental phenomena can be explained by the calculations.
| Original language | English |
|---|---|
| Pages (from-to) | 746-749 |
| Number of pages | 4 |
| Journal | IEEE Electron Device Letters |
| Volume | 29 |
| Issue number | 7 |
| DOIs | |
| State | Published - Jul 2008 |
Keywords
- Nickel silicide (NiSi))
- Schottky barrier (SB) modulation
- Segregation
- Yttrium (Y)
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