A Voltage Sag Source Locating Method with Multiple Screening Criterions Considering Voltage Measurement Errors

  • Xiaotong Du
  • , Haotian Sun
  • , Hao Yi
  • , Fang Zhuo
  • , Shanshan Luo
  • , Xinxiang Wang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Voltage sag location is basis for voltage sag analysis and control. Based on the optimum allocation of voltage sag monitors, this paper proposes a voltage sag source locating method with multiple screening criterions considering the measurement error. Using the off-line database and collected monitor data, the fault located lines are screened out first, and then the fault located segment on the possible faulty lines is screened with Newton interpolation approach. At last, the fault is located via cost function. The simulation of IEEE39 bus model verifies the effectiveness and feasibility of the method. Considering the measurement error improves the accuracy of the locating result; progressively screening out the fault location improves the calculation efficiency and weakens the effect of the mistaken fault point.

Original languageEnglish
Title of host publicationProceedings - 2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538660539
DOIs
StatePublished - 26 Dec 2018
Event2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018 - Shenzhen, China
Duration: 4 Nov 20187 Nov 2018

Publication series

NameProceedings - 2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018

Conference

Conference2018 IEEE International Power Electronics and Application Conference and Exposition, PEAC 2018
Country/TerritoryChina
CityShenzhen
Period4/11/187/11/18

Keywords

  • fault location
  • measurement errors
  • screening method
  • voltage sag

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