TY - GEN
T1 - A simulation of deep dielectric charging induced by dielectric temperature and energetic electrons
AU - Li, Shengtao
AU - Min, Daomin
AU - Lin, Min
AU - Li, Weiwei
AU - Li, Jianying
PY - 2010
Y1 - 2010
N2 - In this paper, a computer numerical simulation of one-dimensional deep dielectric charging (DDC) of spacecrafts induced by temperature and energetic electrons has been developed. It provides a method for spacecraft engineers to analyze the phenomena of DDC in spacecrafts and then to predict whether or when electrostatic discharging (ESD) will occur. The simulation code is developed to analyze the influence of different magnitude of dielectric temperature and energetic electrons flux on deep dielectric charging/discharging occurrence. In the simulation, we find that there exists an ESD inception energetic electron flux threshold. The flux threshold decreases with the decrease of dielectric temperature. It is interesting that there exists a critical dielectric temperature (250 K for low-density polyethylene) in the DDC process. Below the critical temperature or above that, respectively, the energetic electron flux and the dielectric temperature are the dominated influencing factors in the DDC process. Then, considering the DDC electric field and the charging time, we present a rough prediction of discharging occurrence probability with varied flux of energetic electrons and dielectric temperature.
AB - In this paper, a computer numerical simulation of one-dimensional deep dielectric charging (DDC) of spacecrafts induced by temperature and energetic electrons has been developed. It provides a method for spacecraft engineers to analyze the phenomena of DDC in spacecrafts and then to predict whether or when electrostatic discharging (ESD) will occur. The simulation code is developed to analyze the influence of different magnitude of dielectric temperature and energetic electrons flux on deep dielectric charging/discharging occurrence. In the simulation, we find that there exists an ESD inception energetic electron flux threshold. The flux threshold decreases with the decrease of dielectric temperature. It is interesting that there exists a critical dielectric temperature (250 K for low-density polyethylene) in the DDC process. Below the critical temperature or above that, respectively, the energetic electron flux and the dielectric temperature are the dominated influencing factors in the DDC process. Then, considering the DDC electric field and the charging time, we present a rough prediction of discharging occurrence probability with varied flux of energetic electrons and dielectric temperature.
KW - Conductiviyt
KW - Deep dielectric charging (DDC)
KW - Electrostatic discharging (ESD)
KW - Energetic electron environmen
KW - Temperature
UR - https://www.scopus.com/pages/publications/77958075185
U2 - 10.1109/ICSD.2010.5568065
DO - 10.1109/ICSD.2010.5568065
M3 - 会议稿件
AN - SCOPUS:77958075185
SN - 9781424479443
T3 - Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010
BT - Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010
T2 - 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010
Y2 - 4 July 2010 through 9 July 2010
ER -