A Simple dv/dt and di/dt Closed-loop Active Gate Driver for SiC MOSFETs

  • Xuhao Zhu
  • , Wu Chen
  • , Xiaokun He
  • , Yubo Yuan
  • , Chenyu Zhang
  • , Jianyu Yu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This study proposes a novel active gate driver (AGD) to mitigate voltage and current overshoot issues for silicon carbide (SiC) MOSFETs. The AGD integrates the advantages of existing architectures with a closed-loop dv/dt and di/dt hybrid control mechanism, ensuring adaptability to varying load conditions. The circuit design employs simple BJT followers and passive resistor-capacitor networks, offering real-time feedback, rapid transient response and straightforward implementation. Experimental and simulation results demonstrate that the proposed AGD effectively suppresses voltage and current overshoot, while reducing switching losses by 23-35% compared to conventional gate drivers during hard-switching operations. The AGD's simplicity, cost-effectiveness, and versatility validate its practicality for high-performance SiC MOSFET systems, proving its potential in modern power electronics applications.

Original languageEnglish
Title of host publicationIECON 2025 - 51st Annual Conference of the IEEE Industrial Electronics Society
PublisherIEEE Computer Society
ISBN (Electronic)9798331596811
DOIs
StatePublished - 2025
Externally publishedYes
Event51st Annual Conference of the IEEE Industrial Electronics Society, IECON 2025 - Madrid, Spain
Duration: 14 Oct 202517 Oct 2025

Publication series

NameIECON Proceedings (Industrial Electronics Conference)
ISSN (Print)2162-4704
ISSN (Electronic)2577-1647

Conference

Conference51st Annual Conference of the IEEE Industrial Electronics Society, IECON 2025
Country/TerritorySpain
CityMadrid
Period14/10/2517/10/25

Keywords

  • active gate driver (AGD)
  • silicon carbide (SiC)
  • voltage and current overshoot

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