Abstract
Formation of a nanometer-scale oxide surface layer is common when a material is exposed to oxygen-containing environment. Employing aberration-corrected analytical transmission electron microscopy and using single crystal SnSe as an example, we show that for an alloy, a second thin amorphous layer can appear underneath the outmost oxide layer. This inner amorphous layer is not oxide based, but instead originates from solid-state amorphization of the base alloy when its free energy rises to above that of the metastable amorphous state; which is a result of the composition shift due to the preferential depletion of the oxidizing species, in our case, the outgoing Sn reacting with the oxygen atmosphere.
| Original language | English |
|---|---|
| Pages (from-to) | 173-178 |
| Number of pages | 6 |
| Journal | Microscopy and Microanalysis |
| Volume | 23 |
| Issue number | 1 |
| DOIs | |
| State | Published - Feb 2017 |
| Externally published | Yes |
Keywords
- High angle annular dark field (HAADF) imaging
- Interdiffusion
- SnSe single crystal
- Solid-state amorphization
- Surface oxidation
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