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A second amorphous layer underneath surface oxide

  • Bin Zhang
  • , Kunlin Peng
  • , Xuechao Sha
  • , Ang Li
  • , Xiaoyuan Zhou
  • , Yanhui Chen
  • , Qing Song Deng
  • , Dingfeng Yang
  • , Evan Ma
  • , Xiaodong Han
  • Beijing University of Technology
  • Chongqing University
  • Johns Hopkins University

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

Formation of a nanometer-scale oxide surface layer is common when a material is exposed to oxygen-containing environment. Employing aberration-corrected analytical transmission electron microscopy and using single crystal SnSe as an example, we show that for an alloy, a second thin amorphous layer can appear underneath the outmost oxide layer. This inner amorphous layer is not oxide based, but instead originates from solid-state amorphization of the base alloy when its free energy rises to above that of the metastable amorphous state; which is a result of the composition shift due to the preferential depletion of the oxidizing species, in our case, the outgoing Sn reacting with the oxygen atmosphere.

Original languageEnglish
Pages (from-to)173-178
Number of pages6
JournalMicroscopy and Microanalysis
Volume23
Issue number1
DOIs
StatePublished - Feb 2017
Externally publishedYes

Keywords

  • High angle annular dark field (HAADF) imaging
  • Interdiffusion
  • SnSe single crystal
  • Solid-state amorphization
  • Surface oxidation

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