A research on the surface charge with different coating tip by Electrostatic Force Microscope

Zhi Sun; Xuan Wang; Wei Song; Qingquan Lei

doi:10.1109/CEIDP.2013.6748244

A research on the surface charge with different coating tip by Electrostatic Force Microscope

Zhi Sun
, Xuan Wang
, Wei Song
, Qingquan Lei

Harbin University of Science and Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

Electrostatic Force Microscope (EFM) is applied to study of the properties of surface charge of polyimide films in micro-nanometer scale. The charge was injected by different kind of coating tips to the surface of polyimide films. After that the surface charge was characterized by EFM, the result indicated that it was difficult to inject charge with Pt/Ir coating tip for larger work function than Co/Cr coating. The mechanism of electron emission electrode in the experiment is mainly hot electron emission, but also accompanied by field emission. So the barrier height between metal and dielectric had massive influence on the process of Charge injection. This research provides a new method for study on the rule and mechanism of surface charge on the insulated films.

Original language	English
Title of host publication	2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2013
Pages	295-297
Number of pages	3
DOIs	https://doi.org/10.1109/CEIDP.2013.6748244
State	Published - 2013
Externally published	Yes
Event	2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2013 - Shenzhen, China Duration: 20 Oct 2013 → 23 Oct 2013

Publication series

Name	Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
ISSN (Print)	0084-9162

Conference

Conference	2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2013
Country/Territory	China
City	Shenzhen
Period	20/10/13 → 23/10/13

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10.1109/CEIDP.2013.6748244

Cite this

Sun, Z., Wang, X., Song, W., & Lei, Q. (2013). A research on the surface charge with different coating tip by Electrostatic Force Microscope. In 2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2013 (pp. 295-297). Article 6748244 (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP). https://doi.org/10.1109/CEIDP.2013.6748244

@inproceedings{ada18a2f55d447eba06e1b6da77af7a5,

title = "A research on the surface charge with different coating tip by Electrostatic Force Microscope",

abstract = "Electrostatic Force Microscope (EFM) is applied to study of the properties of surface charge of polyimide films in micro-nanometer scale. The charge was injected by different kind of coating tips to the surface of polyimide films. After that the surface charge was characterized by EFM, the result indicated that it was difficult to inject charge with Pt/Ir coating tip for larger work function than Co/Cr coating. The mechanism of electron emission electrode in the experiment is mainly hot electron emission, but also accompanied by field emission. So the barrier height between metal and dielectric had massive influence on the process of Charge injection. This research provides a new method for study on the rule and mechanism of surface charge on the insulated films.",

author = "Zhi Sun and Xuan Wang and Wei Song and Qingquan Lei",

year = "2013",

doi = "10.1109/CEIDP.2013.6748244",

language = "英语",

isbn = "9781479925964",

series = "Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP",

pages = "295--297",

booktitle = "2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2013",

note = "2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2013 ; Conference date: 20-10-2013 Through 23-10-2013",

}

Sun, Z, Wang, X, Song, W & Lei, Q 2013, A research on the surface charge with different coating tip by Electrostatic Force Microscope. in 2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2013., 6748244, Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP, pp. 295-297, 2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2013, Shenzhen, China, 20/10/13. https://doi.org/10.1109/CEIDP.2013.6748244

A research on the surface charge with different coating tip by Electrostatic Force Microscope. / Sun, Zhi; Wang, Xuan; Song, Wei et al.
2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2013. 2013. p. 295-297 6748244 (Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A research on the surface charge with different coating tip by Electrostatic Force Microscope

AU - Sun, Zhi

AU - Wang, Xuan

AU - Song, Wei

AU - Lei, Qingquan

PY - 2013

Y1 - 2013

N2 - Electrostatic Force Microscope (EFM) is applied to study of the properties of surface charge of polyimide films in micro-nanometer scale. The charge was injected by different kind of coating tips to the surface of polyimide films. After that the surface charge was characterized by EFM, the result indicated that it was difficult to inject charge with Pt/Ir coating tip for larger work function than Co/Cr coating. The mechanism of electron emission electrode in the experiment is mainly hot electron emission, but also accompanied by field emission. So the barrier height between metal and dielectric had massive influence on the process of Charge injection. This research provides a new method for study on the rule and mechanism of surface charge on the insulated films.

AB - Electrostatic Force Microscope (EFM) is applied to study of the properties of surface charge of polyimide films in micro-nanometer scale. The charge was injected by different kind of coating tips to the surface of polyimide films. After that the surface charge was characterized by EFM, the result indicated that it was difficult to inject charge with Pt/Ir coating tip for larger work function than Co/Cr coating. The mechanism of electron emission electrode in the experiment is mainly hot electron emission, but also accompanied by field emission. So the barrier height between metal and dielectric had massive influence on the process of Charge injection. This research provides a new method for study on the rule and mechanism of surface charge on the insulated films.

UR - https://www.scopus.com/pages/publications/84901740517

U2 - 10.1109/CEIDP.2013.6748244

DO - 10.1109/CEIDP.2013.6748244

M3 - 会议稿件

AN - SCOPUS:84901740517

SN - 9781479925964

T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

SP - 295

EP - 297

BT - 2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2013

T2 - 2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2013

Y2 - 20 October 2013 through 23 October 2013

ER -

A research on the surface charge with different coating tip by Electrostatic Force Microscope

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