TY - GEN
T1 - A PIC-MCC numerical approach for studying the effect of pulse steepness on vacuum flashover
AU - Mao, Jiale
AU - Wang, Shuang
AU - Wu, Jingshen
AU - Cheng, Yonghong
AU - Bai, Lei
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/7/1
Y1 - 2017/7/1
N2 - Study on nanosecond pulse flashover characteristics of vacuum insulator surface is extremely significant for designing reliable pulse power devices. The rising steepness of pulse voltage greatly affects the flashover process. In this study, a two-dimensional model based on secondary electron emission avalanche (SEEA) scheme was established to study the relationship between pulse rising steepness and flashover performance. Particle-in-cell (PIC) method was used to describe multiplication and propagation behaviors of the charged particles during the flashover process. And collisional ionization process between primary electrons and desorbed gas was described by the Monte Carlo collision (MCC) method. The number evolution, distribution of charged particles, and field distribution at different moments during the flashover process are successfully presented in the simulation. Furthermore, the model shows that higher pulse voltage rising steepness will lead to higher flashover voltage, which accords well with our group's previous experimental results.
AB - Study on nanosecond pulse flashover characteristics of vacuum insulator surface is extremely significant for designing reliable pulse power devices. The rising steepness of pulse voltage greatly affects the flashover process. In this study, a two-dimensional model based on secondary electron emission avalanche (SEEA) scheme was established to study the relationship between pulse rising steepness and flashover performance. Particle-in-cell (PIC) method was used to describe multiplication and propagation behaviors of the charged particles during the flashover process. And collisional ionization process between primary electrons and desorbed gas was described by the Monte Carlo collision (MCC) method. The number evolution, distribution of charged particles, and field distribution at different moments during the flashover process are successfully presented in the simulation. Furthermore, the model shows that higher pulse voltage rising steepness will lead to higher flashover voltage, which accords well with our group's previous experimental results.
UR - https://www.scopus.com/pages/publications/85045223174
U2 - 10.1109/CEIDP.2017.8257505
DO - 10.1109/CEIDP.2017.8257505
M3 - 会议稿件
AN - SCOPUS:85045223174
T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
SP - 757
EP - 760
BT - CEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon, CEIDP 2017
Y2 - 22 October 2017 through 25 October 2017
ER -